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Pregled bibliografske jedinice broj: 621965

Multielectrode Measurement of Conductive Liquid Layer Thickness


Vurin, Dejan; Džapo, Hrvoje
Multielectrode Measurement of Conductive Liquid Layer Thickness // 2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings / Fuchs, Anton ; Varkonyi-Koczy, Annamaria ; Watzenig, Daniel (ur.).
Piscataway (NJ): Institute of Electrical and Electronics Engineers (IEEE), 2012. str. 123-128 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)


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Naslov
Multielectrode Measurement of Conductive Liquid Layer Thickness

Autori
Vurin, Dejan ; Džapo, Hrvoje

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings / Fuchs, Anton ; Varkonyi-Koczy, Annamaria ; Watzenig, Daniel - Piscataway (NJ) : Institute of Electrical and Electronics Engineers (IEEE), 2012, 123-128

ISBN
978-1-4577-1771-0

Skup
International Instrumentation and Measurement Technology Conference, I2MTC 2012

Mjesto i datum
Graz, Austrija, 13.05.2012. - 16.05.2012

Vrsta sudjelovanja
Poster

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
thickness measurement; resistive sensors; liquid property measurement; environmental monitoring

Sažetak
This paper presents a simple low-cost measurement method for determination of a conductive liquid layer thickness with an unknown conductivity, by means of measuring the resistance between pairs of electrodes arranged in a planar multielectrode configuration. The measurement method tolerates unknown layer conductivity variations over a few orders of magnitude, without a significant impact on the measured layer thickness uncertainty. The accuracy of thickness determination was confirmed by an experiment and it is better than 300 um in the range of 2 to 10 mm, for the electrode arrangement optimized for the target thickness range. The applications of the proposed method are numerous, ranging from the industrial quality control, process monitoring, environmental sensing etc.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika



POVEZANOST RADA


Projekti:
036-0362979-1554 - Neinvazivna mjerenja i postupci u biomedicini (Tonković, Stanko, MZO ) ( CroRIS)

Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb

Profili:

Avatar Url Hrvoje Džapo (autor)


Citiraj ovu publikaciju:

Vurin, Dejan; Džapo, Hrvoje
Multielectrode Measurement of Conductive Liquid Layer Thickness // 2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings / Fuchs, Anton ; Varkonyi-Koczy, Annamaria ; Watzenig, Daniel (ur.).
Piscataway (NJ): Institute of Electrical and Electronics Engineers (IEEE), 2012. str. 123-128 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
Vurin, D. & Džapo, H. (2012) Multielectrode Measurement of Conductive Liquid Layer Thickness. U: Fuchs, A., Varkonyi-Koczy, A. & Watzenig, D. (ur.)2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings.
@article{article, author = {Vurin, Dejan and D\v{z}apo, Hrvoje}, year = {2012}, pages = {123-128}, keywords = {thickness measurement, resistive sensors, liquid property measurement, environmental monitoring}, isbn = {978-1-4577-1771-0}, title = {Multielectrode Measurement of Conductive Liquid Layer Thickness}, keyword = {thickness measurement, resistive sensors, liquid property measurement, environmental monitoring}, publisher = {Institute of Electrical and Electronics Engineers (IEEE)}, publisherplace = {Graz, Austrija} }
@article{article, author = {Vurin, Dejan and D\v{z}apo, Hrvoje}, year = {2012}, pages = {123-128}, keywords = {thickness measurement, resistive sensors, liquid property measurement, environmental monitoring}, isbn = {978-1-4577-1771-0}, title = {Multielectrode Measurement of Conductive Liquid Layer Thickness}, keyword = {thickness measurement, resistive sensors, liquid property measurement, environmental monitoring}, publisher = {Institute of Electrical and Electronics Engineers (IEEE)}, publisherplace = {Graz, Austrija} }




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