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Pregled bibliografske jedinice broj: 617568

Structure and morphology of magnetron sputtered W films studied by x-ray methods


Salamon, Krešimir; Milat, Ognjen; Radić, Nikola; Dubček, Pavo; Jerčinović, Marko; Bernstorff, Sigrid
Structure and morphology of magnetron sputtered W films studied by x-ray methods // Journal of physics. D, Applied physics, 46 (2013), 095304-1 doi:10.1088/0022-3727/46/9/095304 (međunarodna recenzija, članak, znanstveni)


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Naslov
Structure and morphology of magnetron sputtered W films studied by x-ray methods

Autori
Salamon, Krešimir ; Milat, Ognjen ; Radić, Nikola ; Dubček, Pavo ; Jerčinović, Marko ; Bernstorff, Sigrid

Izvornik
Journal of physics. D, Applied physics (0022-3727) 46 (2013); 095304-1

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
tungsten (W) thin films; structure; morphology; magnetron sputtering; GIXRD; XRR; GISAXS; X-ray

Sažetak
The structural and morphological studies of a number of tungsten (W) thin films were carried out using grazing incidence x-ray diffraction, x-ray reflectivity and grazing incidence small-angle x- ray scattering. The W films were prepared by magnetron sputtering in an Ar atmosphere at various pressures and with different powers applied to the W target. We find films with metastable β-W or amorphous phase in the form of nano-columns when deposited at high Ar pressure (>5 mTorr) or with low sputtering power (<20 W), respectively. The appearance of the metastable β-W phase is related to the lowered deposition flux of W atoms, increased film porosity and correspondingly to the higher probability of oxygen incorporation. In films with only the β-W phase we find up to 50% reduction in mass density compared with the density of bulk tungsten. The nanoporosity of the W films is discussed in terms of self-shadowing effects.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekti:
035-0352843-2844 - Veza strukturnih i fizikalnih svojstava materijala kontrolirane dimenzionalnosti (Milat, Ognjen, MZOS ) ( CroRIS)
098-0982886-2895 - Novi amorfni i nanostrukturirani tankoslojni materijali (Radić, Nikola, MZOS ) ( CroRIS)

Ustanove:
Institut za fiziku, Zagreb,
Institut "Ruđer Bošković", Zagreb

Poveznice na cjeloviti tekst rada:

doi iopscience.iop.org

Citiraj ovu publikaciju:

Salamon, Krešimir; Milat, Ognjen; Radić, Nikola; Dubček, Pavo; Jerčinović, Marko; Bernstorff, Sigrid
Structure and morphology of magnetron sputtered W films studied by x-ray methods // Journal of physics. D, Applied physics, 46 (2013), 095304-1 doi:10.1088/0022-3727/46/9/095304 (međunarodna recenzija, članak, znanstveni)
Salamon, K., Milat, O., Radić, N., Dubček, P., Jerčinović, M. & Bernstorff, S. (2013) Structure and morphology of magnetron sputtered W films studied by x-ray methods. Journal of physics. D, Applied physics, 46, 095304-1 doi:10.1088/0022-3727/46/9/095304.
@article{article, author = {Salamon, Kre\v{s}imir and Milat, Ognjen and Radi\'{c}, Nikola and Dub\v{c}ek, Pavo and Jer\v{c}inovi\'{c}, Marko and Bernstorff, Sigrid}, year = {2013}, pages = {095304-1-095304-10}, DOI = {10.1088/0022-3727/46/9/095304}, keywords = {tungsten (W) thin films, structure, morphology, magnetron sputtering, GIXRD, XRR, GISAXS, X-ray}, journal = {Journal of physics. D, Applied physics}, doi = {10.1088/0022-3727/46/9/095304}, volume = {46}, issn = {0022-3727}, title = {Structure and morphology of magnetron sputtered W films studied by x-ray methods}, keyword = {tungsten (W) thin films, structure, morphology, magnetron sputtering, GIXRD, XRR, GISAXS, X-ray} }
@article{article, author = {Salamon, Kre\v{s}imir and Milat, Ognjen and Radi\'{c}, Nikola and Dub\v{c}ek, Pavo and Jer\v{c}inovi\'{c}, Marko and Bernstorff, Sigrid}, year = {2013}, pages = {095304-1-095304-10}, DOI = {10.1088/0022-3727/46/9/095304}, keywords = {tungsten (W) thin films, structure, morphology, magnetron sputtering, GIXRD, XRR, GISAXS, X-ray}, journal = {Journal of physics. D, Applied physics}, doi = {10.1088/0022-3727/46/9/095304}, volume = {46}, issn = {0022-3727}, title = {Structure and morphology of magnetron sputtered W films studied by x-ray methods}, keyword = {tungsten (W) thin films, structure, morphology, magnetron sputtering, GIXRD, XRR, GISAXS, X-ray} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


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