Pregled bibliografske jedinice broj: 596200
Oscillations in spectral behaviour of total losses (1-R-T) in thin dielectric films
Oscillations in spectral behaviour of total losses (1-R-T) in thin dielectric films // Optics express, 20 (2012), 16129-16144 doi:10.1364/OE.20.016129 (međunarodna recenzija, članak, znanstveni)
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Naslov
Oscillations in spectral behaviour of total losses (1-R-T) in thin dielectric films
Autori
Amotchkina, T.V. ; Trubetskov, M.K. ; Tikhonravov, A.V. ; Janicki, Vesna ; Sancho-Parramon, Jordi ; Razskazovskaya, O. ; Pervak, V.
Izvornik
Optics express (1094-4087) 20
(2012);
16129-16144
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
Materials and process characterization; Interference coatings; Thin films; optical properties; Deposition and fabrication
Sažetak
We explain reasons of oscillations frequently observed in total losses spectra (1−R−T) calculated on the basis of measurement spectral photometric data of thin film samples. The first reason of oscillations is related to difference in angles of incidence at which spectral transmittance and reflectance are measured. The second reason is an absorption in a thin film. The third reason is a slight thickness non-uniformity of the film. We observe a good agreement between theoretical models and corresponding measurements, which proves above statements on the origins of oscillations in total losses.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Projekti:
098-0000000-3191 - Optička svojstva nanostrukturnih slojeva (Zorc, Hrvoje, MZOS ) ( CroRIS)
Ustanove:
Institut "Ruđer Bošković", Zagreb
Poveznice na cjeloviti tekst rada:
Pristup cjelovitom tekstu rada doi www.opticsinfobase.org dx.doi.orgCitiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
- MEDLINE