Pregled bibliografske jedinice broj: 550659
Integration of PIXE and XRF spectrometries for simultaneous applications
Integration of PIXE and XRF spectrometries for simultaneous applications // European Conference on X-ray Spectrometry (EXRS): Book of apstracts. Coimbra, Portugal, 2010
Coimbra, Portugal; Figueira da Foz, Portugal, 2010. (poster, međunarodna recenzija, sažetak, znanstveni)
CROSBI ID: 550659 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Integration of PIXE and XRF spectrometries for simultaneous applications
Autori
Desnica, Vladan ; Fazinić Stjepko ; Bogovac, Mladen
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
European Conference on X-ray Spectrometry (EXRS): Book of apstracts. Coimbra, Portugal, 2010
/ - , 2010
Skup
European X-ray Spectrometry
Mjesto i datum
Coimbra, Portugal; Figueira da Foz, Portugal, 20.06.2010. - 25.06.2010
Vrsta sudjelovanja
Poster
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
XRF; PIXE; method integration
Sažetak
Particle induced X-ray emission (PIXE) and X-ray fluorescence (XRF) analysis both offer high analytical potential for multi-elemental investigations and material characterization. In this work unification of the two methods is investigated and the results are discussed. Integration of the techniques into one setup and their combined use exploits the complementarities of the two methods, and by broadening the sensitivity for low and high Z elements it allows even more precise elemental characterization of a sample under investigation. Furthermore, by mounting an X-ray source within a PIXE chamber, and using the existing PIXE detection system, positioning mechanism and electronics, a fully operational XRF system is acquired without much further investment. This allows easy and fast preliminary XRF screening and bulk analysis of the samples prior to a PIXE measurement, or simply provides an alternative technique when ion beam from the accelerator is not available. Additionally, this setup could be useful for investigating the effects of combined PIXE and XRF sample excitation.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Projekti:
260-0000000-3190 - Razvoj i primjena nuklearnih metoda za istraživanje i zaštitu kulturne baštine (Desnica, Vladan, MZOS ) ( CroRIS)
Ustanove:
Institut "Ruđer Bošković", Zagreb,
Akademija likovnih umjetnosti, Zagreb