Pregled bibliografske jedinice broj: 544903
Heavily phosphorus doped polycrystalline silicon with the application in the field of thermoelectrics
Heavily phosphorus doped polycrystalline silicon with the application in the field of thermoelectrics // NATO ADVANCED RESEARCH WORKSHOP New materials for thermoelectric applications: theory and experiment
Hvar, Hrvatska, 2011. (poster, nije recenziran, sažetak, znanstveni)
CROSBI ID: 544903 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Heavily phosphorus doped polycrystalline silicon with the application in the field of thermoelectrics
Autori
Žonja, Sanja ; Očko, Miroslav ; Ivanda, Mile ; Suligoj, Tomislav ; Koričić, Marko ; Biljanović, Petar
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Skup
NATO ADVANCED RESEARCH WORKSHOP New materials for thermoelectric applications: theory and experiment
Mjesto i datum
Hvar, Hrvatska, 19.09.2011. - 25.09.2011
Vrsta sudjelovanja
Poster
Vrsta recenzije
Nije recenziran
Ključne riječi
heavily doped polycrystalline silicon; phosphorus; thermoelectrics; thermopower; reistivity; low temperature measurements
Sažetak
Until recently, the field of thermoelectrics marked silicon as an utterly poorly performing material. However, in the recent few years, due to development of the experimental methods that influenced the decrease of the grain size in the polycrystalline material and lowering of dimensionality, silicon gained increased attention. In this study, we analyzed heavily phosphorus doped poylcrystalline silicon samples prepared in the following way: the amorphous samples were obtained using parallel flows of silane and phosphine in LPCVD furnace at 530°C and thereafter subjected to rapid thermal annealing in different time intervals at 950°C. According to SIMS, the concentration of phosphorus is 2·10<sup>20</sup> cm<sup>-3</sup> for each sample. Samples were analyzed using Raman spectroscopy, SEM, four point probe, low temperature resistivity and Seebeck coefficient measurements. Samples are in the metallic regime from the lowest temperatures measured. Seebeck coefficient shows linear temperature dependence above 150 K where the resistivity shows the T<sup>3/2</sup> dependence in the same temperature range. The quality of samples obtained in this way was evaluated by comparing them to some crystalline samples in the same dopant concentration range. We also discuss application possibilities of these samples as thermoelectrics and in microelectronics.
Izvorni jezik
Engleski
Znanstvena područja
Fizika, Elektrotehnika
POVEZANOST RADA
Projekti:
035-0352827-2841 - Materijali sa elektronskom strukturom modeliranom modernim tehnikama priprave (Aviani, Ivica, MZOS ) ( CroRIS)
036-0361566-1567 - Nanometarski elektronički elementi i sklopovske primjene (Suligoj, Tomislav, MZO ) ( CroRIS)
036-0982904-1642 - Sofisticirane poluvodičke strukture za komunikacijsku tehnologiju (Koričić, Marko, MZO ) ( CroRIS)
098-0982904-2898 - Fizika i primjena nanostruktura i volumne tvari (Ivanda, Mile, MZOS ) ( CroRIS)
Ustanove:
Institut za fiziku, Zagreb,
Fakultet elektrotehnike i računarstva, Zagreb,
Institut "Ruđer Bošković", Zagreb
Profili:
Sanja Žonja
(autor)
Petar Biljanović
(autor)
Tomislav Suligoj
(autor)
Miroslav Očko
(autor)
Mile Ivanda
(autor)
Marko Koričić
(autor)