Pregled bibliografske jedinice broj: 539866
Comparison of two techniques for reliable characterization of thin metal–dielectric films
Comparison of two techniques for reliable characterization of thin metal–dielectric films // Applied optics, 50 (2011), 33; 6189-6197 doi:10.1364/AO.50.006189 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 539866 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Comparison of two techniques for reliable characterization of thin metal–dielectric films
Autori
Amotchkina, Tatiana ; Trubetskov, Michael ; Tikhonravov, Alexander ; Janicki, Vesna ; Sancho-Parramon, Jordi ; Zorc, Hrvoje
Izvornik
Applied optics (0003-6935) 50
(2011), 33;
6189-6197
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
interference coatings ; deposition and fabrication ; materials and process characterization ; thin films optical properties ; metallic ; opaque and absorbing coatings
Sažetak
In the present study we determine the optical parameters of thin metal–dielectric films using two different characterization techniques based on nonparametric and multiple oscillator models. We consider four series of thin metal–dielectric films produced under various deposition conditions with different optical properties. We compare characterization results obtained by nonparametric and multiple oscillator techniques and demonstrate that the results are consistent. The consistency of the results proves their reliability.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Projekti:
MZOS-098-0000000-3191 - Optička svojstva nanostrukturnih slojeva (Zorc, Hrvoje, MZOS ) ( CroRIS)
Ustanove:
Institut "Ruđer Bošković", Zagreb
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
- MEDLINE
