Pregled bibliografske jedinice broj: 516191
Nickel nanoparticles formed by magnetron sputtering
Nickel nanoparticles formed by magnetron sputtering // 18th International Scientific Meeting on Vacuum Science and Technique: Programme and Book of Abstracts / Mozetič, Miran ; Vesel, Alenka (ur.).
Ljubljana: Slovenian Society for Vacuum Technique (DVTS), 2011. str. 14-14 (pozvano predavanje, međunarodna recenzija, sažetak, znanstveni)
CROSBI ID: 516191 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Nickel nanoparticles formed by magnetron sputtering
Autori
Jerčinović, Marko ; Radić, Nikola ; Buljan, Maja ; Dubček, Pavo ; Ristić, Mira ; Sancho-Parramon, Jordi ; Salamon, Krešimir ; Bernstorff, Sigrid ; Holý, Václav
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
18th International Scientific Meeting on Vacuum Science and Technique: Programme and Book of Abstracts
/ Mozetič, Miran ; Vesel, Alenka - Ljubljana : Slovenian Society for Vacuum Technique (DVTS), 2011, 14-14
ISBN
978-961-92989-2-3
Skup
18th International Scientific Meeting on Vacuum Science and Techniques
Mjesto i datum
Bohinj, Slovenija, 02.06.2011. - 03.06.2011
Vrsta sudjelovanja
Pozvano predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
nickel; nanoparticles; magnetron sputtering; silica; multilayers
Sažetak
Thin nickel films (2-16 nm) have been deposited onto monocrystalline (Si, sapphire) and glassy substrates (fused silica, glass) held at room temperature, 300°C, and 450°C, respectively. Further, Ni nanoparticles (NP) have been formed by codeposition of nickel and silica (or alumina), either in a single mixed layer, or as a multilayer (10 or 20 bilayers) stack which were subsequently annealed in order to improve the NP's crystallinity and 3-dim ordering. The nickel concentration within the mixed layers, dielectric spacer thickness, and substrate temperature were varied in these depositions, respectively. The prepared samples have been characterized by the appropriate methods: the average thickness of the pure Ni films and multilayer periodicity was determined by the XRR, while the film surface topography has been observed by the AFM and SEM. GISAXS measurements were performed at Sincrotrone Trieste, at 8 keV and with the 2-dim detector. Optical and magnetic properties of either surface Ni-nanoclusters or Ni-nanoparticles embedded into dielectric matrix have been probed, as well.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Projekti:
098-0982886-2895 - Novi amorfni i nanostrukturirani tankoslojni materijali (Radić, Nikola, MZOS ) ( CroRIS)
Ustanove:
Institut za fiziku, Zagreb,
Institut "Ruđer Bošković", Zagreb
Profili:
Nikola Radić
(autor)
Jordi Sancho Parramon
(autor)
Maja Mičetić
(autor)
Marko Jerčinović
(autor)
Krešimir Salamon
(autor)
Pavo Dubček
(autor)
Mira Ristić
(autor)