Naslov
Structural analysis of monolayered and bilayered SnO2 thin films

Autori
Djerdj, Igor ; Gracin, Davor ; Juraić, Krunoslav ; Meljanac, Daniel ; Bogdanović-Radović, Ivančica ; Pletikapić, Galja

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni

Skup
EMRS-2011 Spring Meeting

Mjesto i datum
Nica, Francuska, 09.05.2011. - 13.05.2011

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
transparent conductive oxides; thin film; X-ray diffraction; Rietveld analysis; preferred orientation

Sažetak
Mono- and bilayered undoped and fluorine doped SnO2 thin films have been successfully prepared at optimized postdeposition temperatures of 590 and 610 °C by the atmospheric pressure chemical vapor deposition method. The microstructural properties of as-deposited films were thoroughly examined using the Rietveld refinement of powder-like XRD patterns, while the film surface has been probed using atomic field microscopy. The structural parameters were correlated to the deposition parameters and interesting findings were revealed. Finally, the specific electrical resistivity of the thin films has been measured and correlated with the optical transmittance.

Izvorni jezik
Engleski

Znanstvena područja
Fizika

POVEZANOST RADA