Pregled bibliografske jedinice broj: 499133
Semiconducting properties of anodically formed layer on antimony
Semiconducting properties of anodically formed layer on antimony // Electrochimica acta, 23 (1978), 12; 1371-1376 doi:10.1016/0013-4686(78)80019-X (međunarodna recenzija, članak, znanstveni)
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Naslov
Semiconducting properties of anodically formed layer on antimony
Autori
Metikoš-Huković, Mirjana ; Lovreček, Branko
Izvornik
Electrochimica acta (0013-4686) 23
(1978), 12;
1371-1376
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
antimony; oxide film; semiconducting properties; photopolarization measurements
Sažetak
Results of photopolarization, photoconductivity and double layer capacity measurements for the sytem Sb/oxide layer/electrolyte have been given. On the basis of the above measurements it has been concluded that anolic layers on antimony as examined are semiconductors of n-type, band gap Eg=3 eV and donor density ND≈1017 cm−3. The dependence of photovoltage on barrier layer thickness of the Schottky type calculated on the basis of experimental results, also supports the above conclusion, that is, the minimum thickness in which significant photo-effect still appears is of the order of magnitude 10−5 cm, which seems plausible with respect to the expected of light absorption coefficient.
Izvorni jezik
Engleski
Znanstvena područja
Kemija
POVEZANOST RADA
Ustanove:
Fakultet kemijskog inženjerstva i tehnologije, Zagreb
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus