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Pregled bibliografske jedinice broj: 487386

Metastability Testing at FPGA Circuit Design using Propagation Time Characterization

Medved Rogina, Branka; Škoda, Peter; Skala, Karolj; Michieli, Ivan; Vlah, Maja; Marijan, Siniša
Metastability Testing at FPGA Circuit Design using Propagation Time Characterization // Proceedings of East-WestDesign & Test Symposium (EWDTS'10) / Hahanov, Vladimir ; Zorian, Yervant (ur.).
Sankt Peterburg: Institute of Electrical and Electronics Engineers (IEEE), 2010. str. 80-85 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)

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Naslov
Metastability Testing at FPGA Circuit Design using Propagation Time Characterization

Autori
Medved Rogina, Branka ; Škoda, Peter ; Skala, Karolj ; Michieli, Ivan ; Vlah, Maja ; Marijan, Siniša

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
Proceedings of East-WestDesign & Test Symposium (EWDTS'10) / Hahanov, Vladimir ; Zorian, Yervant - Sankt Peterburg : Institute of Electrical and Electronics Engineers (IEEE), 2010, 80-85

ISBN
978-1-4244-9555-9

Skup
EWDTS'10 - East-WestDesign & Test Symposium, St. Petersburg, Russia, September 17-20

Mjesto i datum
Sankt Peterburg, Ruska Federacija, 17.09.2010. - 20.09.2010

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
FPGA; metastability; propagation delay; MTBF

Sažetak
This paper describes the measurement method and experimental technique with advanced instrumentation setup for analysing the metastability behavior and performance measurement of flip-flops used in programmable logic devices. In order to demonstrate this testing approach, the results for metastable characteristics parameters of one FPGA digital circuit fabricated commercially in 90 nm CMOS process are presented. The same test methods can also be used for evaluation of timing reliability in digital circuits as well.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika



POVEZANOST RADA

Projekti:
098-0982560-2566 - Mjerenje i karakterizacija podataka iz stvarnog svijeta (Medved-Rogina, Branka, MZOS ) ( CroRIS)
098-0982562-2567 - Metode znanstvene vizualizacije (Skala, Karolj, MZOS ) ( CroRIS)

Ustanove:
KONČAR - Institut za elektrotehniku d.d.

Profili:

Avatar Url Peter Škoda (autor)

Avatar Url Ivan Michieli (autor)

Avatar Url Maja Vlah (autor)

Avatar Url Karolj Skala (autor)

Avatar Url Branka Medved-Rogina (autor)

Avatar Url Siniša Marijan (autor)

Citiraj ovu publikaciju:

Medved Rogina, Branka; Škoda, Peter; Skala, Karolj; Michieli, Ivan; Vlah, Maja; Marijan, Siniša
Metastability Testing at FPGA Circuit Design using Propagation Time Characterization // Proceedings of East-WestDesign & Test Symposium (EWDTS'10) / Hahanov, Vladimir ; Zorian, Yervant (ur.).
Sankt Peterburg: Institute of Electrical and Electronics Engineers (IEEE), 2010. str. 80-85 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
Medved Rogina, B., Škoda, P., Skala, K., Michieli, I., Vlah, M. & Marijan, S. (2010) Metastability Testing at FPGA Circuit Design using Propagation Time Characterization. U: Hahanov, V. & Zorian, Y. (ur.)Proceedings of East-WestDesign & Test Symposium (EWDTS'10).
@article{article, author = {Medved Rogina, Branka and \v{S}koda, Peter and Skala, Karolj and Michieli, Ivan and Vlah, Maja and Marijan, Sini\v{s}a}, year = {2010}, pages = {80-85}, keywords = {FPGA, metastability, propagation delay, MTBF}, isbn = {978-1-4244-9555-9}, title = {Metastability Testing at FPGA Circuit Design using Propagation Time Characterization}, keyword = {FPGA, metastability, propagation delay, MTBF}, publisher = {Institute of Electrical and Electronics Engineers (IEEE)}, publisherplace = {Sankt Peterburg, Ruska Federacija} }
@article{article, author = {Medved Rogina, Branka and \v{S}koda, Peter and Skala, Karolj and Michieli, Ivan and Vlah, Maja and Marijan, Sini\v{s}a}, year = {2010}, pages = {80-85}, keywords = {FPGA, metastability, propagation delay, MTBF}, isbn = {978-1-4244-9555-9}, title = {Metastability Testing at FPGA Circuit Design using Propagation Time Characterization}, keyword = {FPGA, metastability, propagation delay, MTBF}, publisher = {Institute of Electrical and Electronics Engineers (IEEE)}, publisherplace = {Sankt Peterburg, Ruska Federacija} }

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