Pregled bibliografske jedinice broj: 48241
High-resolution transmission electron microscopy (HRTEM): image processing analysis of defects and grain boundaries in nanocrystalline materials
High-resolution transmission electron microscopy (HRTEM): image processing analysis of defects and grain boundaries in nanocrystalline materials // Acta chimica slovenica, 46 (1999), 3; 435-461 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 48241 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
High-resolution transmission electron microscopy (HRTEM): image processing analysis of defects and grain boundaries in nanocrystalline materials
Autori
Tonejc, Anđelka
Izvornik
Acta chimica slovenica (1318-0207) 46
(1999), 3;
435-461
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
HRTEM; image processing; nanocrystalline materials
Sažetak
A brief overview of the application of the high resolution transmision electron microscopy (HRTEM) method is given: the principle of HRTEM image formation in an electrone microscope; different modes of image formation; the role of the contrast transfer function in HRTEM image formation; definition and improvement of electron microscope resolution. In theis work the results obtained by applying the CRISP program to analyse the HRTEM photopgraphs of mechanically allyed nanocrystalline materials are presented.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Projekti:
119202
Ustanove:
Prirodoslovno-matematički fakultet, Zagreb
Profili:
Anđelka Tonejc
(autor)
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
