Pregled bibliografske jedinice broj: 462105
Ion-induced noncollisional ejection of positive secondary ions
Ion-induced noncollisional ejection of positive secondary ions // Surface science, 259 (1991), 1-2; 215-220 doi:10.1016/0039-6028(91)90539-5 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 462105 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Ion-induced noncollisional ejection of positive secondary ions
Autori
Petravić, Mladen ; Williams, J.S.
Izvornik
Surface science (0039-6028) 259
(1991), 1-2;
215-220
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
ion bombardment ; electron bombardment ; secondary ion formation
Sažetak
Energy distributions of secondary ions emitted during either energetic ion bombardment or low-energy electron bombardment have been studied for fluorine and oxygen impurities in fluorinated NiCr and a thin diamond film on a silicon substrate. A close similarity has been found for ion- induced and electron-induced energy distributions of O+ from diamond as well as for F+ from NiCr. This suggests energetically identical, electron-mediated processes dominate positive ion emission in both cases. From threshold measurements of electron stimulated desorption (ESD) for O+ and F+, an Auger decay process emerges as a possible explanation.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Citiraj ovu publikaciju:
Časopis indeksira:
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
