Pregled bibliografske jedinice broj: 461113
Surface near-edge x-ray adsorption fine structure of hydrogenated diamond films and Di(100) surfaces studied by H+ and H- ion desorption
Surface near-edge x-ray adsorption fine structure of hydrogenated diamond films and Di(100) surfaces studied by H+ and H- ion desorption // Applied physics letters, 73 (1998), 8; 1152-1154 (međunarodna recenzija, članak, znanstveni)
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Naslov
Surface near-edge x-ray adsorption fine structure of hydrogenated diamond films and Di(100) surfaces studied by H+ and H- ion desorption
Autori
Hoffman, A. ; Comtet, G. ; Hellner, L. ; Dujardin, G. ; Petravić, Mladen
Izvornik
Applied physics letters (0003-6951) 73
(1998), 8;
1152-1154
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
NEXAFS; hydrogen ions
Sažetak
The near-edge x-ray absorption fine structures (NEXAFS) of hydrogenated diamond films and single-crystal diamond surfaces have been studied by recording the partial electron yield and the H+ and H- ion desorption yields as a function of photon energies around the C(1s) core level. It has been found that ion desorption is much more surface sensitive than electron emission, especially for the C(1s)-sigma*(C-H) surface resonance which is enhanced in the Hf ion yield. This enhanced surface sensitivity of ion desorption has enabled us to compare in detail the surface NEXAFS structure of both hydrogenated surfaces and to ascertain the quality of the diamond film.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
