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Pregled bibliografske jedinice broj: 449389

Interaction of defects and metals with nanocavities in silicon


Williams, J.S.; Ridgway, M.C.; Conway, M.J.; Williams, J. S.; Ridgway, M. C.; Conway, M. J.; Wong-Leung, J.; Zhu, X. F.; Petravić, Mladen; Fortuna, F. et al.
Interaction of defects and metals with nanocavities in silicon // Nuclear instruments & methods in physics research. Section B : Beam interactions with materials and atoms, 178 (2001), 1/4; 33-43 doi:10.1016/S0168-583X(01)00503-1 (međunarodna recenzija, članak, znanstveni)


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Naslov
Interaction of defects and metals with nanocavities in silicon

Autori
Williams, J.S. ; Ridgway, M.C. ; Conway, M.J. ; Williams, J. S. ; Ridgway, M. C. ; Conway, M. J. ; Wong-Leung, J. ; Zhu, X. F. ; Petravić, Mladen ; Fortuna, F. ; Ruault, M. -O. ; Bernas, H. ; Kinomura, A. ; Nakano, Y. ; Hayashi, Y.

Izvornik
Nuclear instruments & methods in physics research. Section B : Beam interactions with materials and atoms (0168-583X) 178 (2001), 1/4; 33-43

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
ion implantation; Si; He; H; nanocavities

Sažetak
Ion implantation of H or He into silicon, followed by annealing can create a band of nanocavities. Such nanocavities can exhibit a range of interesting and often non-equilibrium interactions with defects and metals during subsequent implantation and annealing. This paper gives an overview of such interactions, concentrating on cavities produced by H-implantation. The evolution of cavities during annealing is briefly treated, followed by illustrations of the very efficient gettering ability of cavities for fast diffusing metals. For low metal concentrations introduced into the near-surface by implantation, the metal atoms decorate the cavity walls during annealing but can be displaced by oxygen under certain conditions. At high metal concentrations, precipitation and second phase (silicide) formation can occur at cavities but silicide formation and dissolution are found to be controlled by the availability or removal of silicon interstitials, leading to non-equilibrium behaviour. When silicon that contains cavities is irradiated with silicon ions, irradiation-induced defects interact with cavities, leading to preferential amorphisation at certain temperatures. Continued irradiation leads to cavity shrinkage during bombardment, which is most efficient when the region around the cavities is amorphised.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Poveznice na cjeloviti tekst rada:

doi www.sciencedirect.com www.sciencedirect.com

Citiraj ovu publikaciju:

Williams, J.S.; Ridgway, M.C.; Conway, M.J.; Williams, J. S.; Ridgway, M. C.; Conway, M. J.; Wong-Leung, J.; Zhu, X. F.; Petravić, Mladen; Fortuna, F. et al.
Interaction of defects and metals with nanocavities in silicon // Nuclear instruments & methods in physics research. Section B : Beam interactions with materials and atoms, 178 (2001), 1/4; 33-43 doi:10.1016/S0168-583X(01)00503-1 (međunarodna recenzija, članak, znanstveni)
Williams, J., Ridgway, M., Conway, M., Williams, J., Ridgway, M., Conway, M., Wong-Leung, J., Zhu, X., Petravić, M. & Fortuna, F. (2001) Interaction of defects and metals with nanocavities in silicon. Nuclear instruments & methods in physics research. Section B : Beam interactions with materials and atoms, 178 (1/4), 33-43 doi:10.1016/S0168-583X(01)00503-1.
@article{article, author = {Williams, J.S. and Ridgway, M.C. and Conway, M.J. and Williams, J. S. and Ridgway, M. C. and Conway, M. J. and Wong-Leung, J. and Zhu, X. F. and Petravi\'{c}, Mladen and Fortuna, F. and Ruault, M. -O. and Bernas, H. and Kinomura, A. and Nakano, Y. and Hayashi, Y.}, year = {2001}, pages = {33-43}, DOI = {10.1016/S0168-583X(01)00503-1}, keywords = {ion implantation, Si, He, H, nanocavities}, journal = {Nuclear instruments and methods in physics research. Section B : Beam interactions with materials and atoms}, doi = {10.1016/S0168-583X(01)00503-1}, volume = {178}, number = {1/4}, issn = {0168-583X}, title = {Interaction of defects and metals with nanocavities in silicon}, keyword = {ion implantation, Si, He, H, nanocavities} }
@article{article, author = {Williams, J.S. and Ridgway, M.C. and Conway, M.J. and Williams, J. S. and Ridgway, M. C. and Conway, M. J. and Wong-Leung, J. and Zhu, X. F. and Petravi\'{c}, Mladen and Fortuna, F. and Ruault, M. -O. and Bernas, H. and Kinomura, A. and Nakano, Y. and Hayashi, Y.}, year = {2001}, pages = {33-43}, DOI = {10.1016/S0168-583X(01)00503-1}, keywords = {ion implantation, Si, He, H, nanocavities}, journal = {Nuclear instruments and methods in physics research. Section B : Beam interactions with materials and atoms}, doi = {10.1016/S0168-583X(01)00503-1}, volume = {178}, number = {1/4}, issn = {0168-583X}, title = {Interaction of defects and metals with nanocavities in silicon}, keyword = {ion implantation, Si, He, H, nanocavities} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


Citati:





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