Pregled bibliografske jedinice broj: 449376
A new horizon in secondary neutral mass spectrometry : post-ionization using a VUV free electron laser
A new horizon in secondary neutral mass spectrometry : post-ionization using a VUV free electron laser // Applied surface science, 231/232 (2004), 1; 962-966 doi:10.1016/j.apsusc.2004.03.191 (međunarodna recenzija, članak, znanstveni)
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Naslov
A new horizon in secondary neutral mass spectrometry : post-ionization using a VUV free electron laser
Autori
Veryovkin, I.V. ; Calaway, W. F. ; Moore, J. F. ; Pellin, M. J. ; Lewellen, J.W. ; Li, Y. ; Milton, S.V. ; King, B.V. ; Petravić, Mladen
Izvornik
Applied surface science (0169-4332) 231/232
(2004), 1;
962-966
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
secondary neutral mass spectrometry; photoionization of atoms and molecules; laser desorption; free electron laser
Sažetak
A new time-of-flight (TOF) mass spectrometer incorporating post-ionization of sputtered neutral species with tunable vacuum ultraviolet (VUV) light generated by a free electron laser (FEL) has been developed. Capabilities of this instrument, called SPIRIT, were demonstrated by experiments with photoionization of sputtered neutral gold atoms with 125 nm light generated by the VUV FEL located at Argonne National Laboratory (ANL). In a separate series of experiments with a fixed wavelength VUV light source, a 157 nm F2 laser, a useful yield (atoms detected per atoms sputtered) of about 12% and a mass resolution better than 1500 were demonstrated for molybdenum.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Napomena
Proceedings of the Fourteenth International Conference on Secondary Ion Mass Spectrometry and Related Topics ; San Diego, California
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus