Pregled bibliografske jedinice broj: 42011
Grazing-incidence small-angle X-ray scattering on nanosized vanadium oxide and V/Ce oxide films
Grazing-incidence small-angle X-ray scattering on nanosized vanadium oxide and V/Ce oxide films // Materials science and engineering B : solid state materials for advanced technology, 79 (2001), 1; 11-15 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 42011 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Grazing-incidence small-angle X-ray scattering on nanosized vanadium oxide and V/Ce oxide films
Autori
Turković, Aleksandra ; Crnjak-Orel, Zorica ; Dubček, Pavo
Izvornik
Materials science and engineering B : solid state materials for advanced technology (0921-5107) 79
(2001), 1;
11-15
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
small-angle scattering X-ray; nanocrystalline-materials-structure; GISAXS; thin films; V/Ce oxide; dip-coating
Sažetak
Vanadium oxide and new V/Ce oxide films on glass substrate were obtained by sol-gel dip-coating process. The average grain radius <R>, obtained by grazing-incidence small-angle X-ray scattering (GISAXS) for pure V2O5 was 7, 49+-1.06 nm. The average grain size <R> for mixed oxides depends on the atomic percent of V in the sample. The fractal nature of some of these samples is analyzed.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
