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Pregled bibliografske jedinice broj: 406712

Optical spectroscopy study of nc-Si based p-i-n solar cells

Sancho-Parramon, Jordi; Gracin, Davor; Modreanu, Mircea; Gajović, Andreja
Optical spectroscopy study of nc-Si based p-i-n solar cells // Solar Energy Materials and Solar Cells, 93 (2009), 10; 1768-1772 doi:10.1016/j.solmat.2009.06.008 (međunarodna recenzija, članak, znanstveni)

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Naslov
Optical spectroscopy study of nc-Si based p-i-n solar cells

Autori
Sancho-Parramon, Jordi ; Gracin, Davor ; Modreanu, Mircea ; Gajović, Andreja

Izvornik
Solar Energy Materials and Solar Cells (0927-0248) 93 (2009), 10; 1768-1772

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
optical properties; nanocrystalline silicon; ellipsometry; photothermal deflection spectroscopy

Sažetak
In the present study we analyzed nanocrystalline silicon (nc-Si) based p-i-n thin film structures (SiC/nc-Si/n-doped amorphous Si) on glass produced by radio-frequency plasma enhanced chemical vapor deposition. The crystallinity of the nc-Si layer was modified by varying the deposition conditions ([SiH4]/[H2] ratio in the plasma and radio-frequency power). Structural properties of the samples (crystalline fraction and crystal size distribution) were inferred by Raman spectroscopy. Different optical spectroscopy methods were combined for the determination of the optical constants in different spectral ranges: spectrophotometry, ellipsometry and photothermal deflection spectroscopy. Characterization results evidence that the optical properties of the nc-Si layers are strongly connected with the layer structural properties. Thus, the correlation between density of defects, Urbach energy, band-gap and line-shape of dielectric function critical points with the crystalline properties of the films is established.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA

Projekti:
098-0982886-2894 - Tanki filmovi legura silicija na prijelazu iz amorfne u uređenu strukturu (Gracin, Davor, MZOS ) ( CroRIS)
098-0982904-2898 - Fizika i primjena nanostruktura i volumne tvari (Ivanda, Mile, MZOS ) ( CroRIS)

Ustanove:
Institut "Ruđer Bošković", Zagreb

Profili:

Avatar Url Davor Gracin (autor)

Avatar Url Andreja Gajović (autor)

Avatar Url Jordi Sancho Parramon (autor)

Poveznice na cjeloviti tekst rada:

doi dx.doi.org

Citiraj ovu publikaciju:

Sancho-Parramon, Jordi; Gracin, Davor; Modreanu, Mircea; Gajović, Andreja
Optical spectroscopy study of nc-Si based p-i-n solar cells // Solar Energy Materials and Solar Cells, 93 (2009), 10; 1768-1772 doi:10.1016/j.solmat.2009.06.008 (međunarodna recenzija, članak, znanstveni)
Sancho-Parramon, J., Gracin, D., Modreanu, M. & Gajović, A. (2009) Optical spectroscopy study of nc-Si based p-i-n solar cells. Solar Energy Materials and Solar Cells, 93 (10), 1768-1772 doi:10.1016/j.solmat.2009.06.008.
@article{article, author = {Sancho-Parramon, Jordi and Gracin, Davor and Modreanu, Mircea and Gajovi\'{c}, Andreja}, year = {2009}, pages = {1768-1772}, DOI = {10.1016/j.solmat.2009.06.008}, keywords = {optical properties, nanocrystalline silicon, ellipsometry, photothermal deflection spectroscopy}, journal = {Solar Energy Materials and Solar Cells}, doi = {10.1016/j.solmat.2009.06.008}, volume = {93}, number = {10}, issn = {0927-0248}, title = {Optical spectroscopy study of nc-Si based p-i-n solar cells}, keyword = {optical properties, nanocrystalline silicon, ellipsometry, photothermal deflection spectroscopy} }
@article{article, author = {Sancho-Parramon, Jordi and Gracin, Davor and Modreanu, Mircea and Gajovi\'{c}, Andreja}, year = {2009}, pages = {1768-1772}, DOI = {10.1016/j.solmat.2009.06.008}, keywords = {optical properties, nanocrystalline silicon, ellipsometry, photothermal deflection spectroscopy}, journal = {Solar Energy Materials and Solar Cells}, doi = {10.1016/j.solmat.2009.06.008}, volume = {93}, number = {10}, issn = {0927-0248}, title = {Optical spectroscopy study of nc-Si based p-i-n solar cells}, keyword = {optical properties, nanocrystalline silicon, ellipsometry, photothermal deflection spectroscopy} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus

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