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Pregled bibliografske jedinice broj: 401695

Suppression of Corner Effects in Triple-Gate Bulk FinFETs

Poljak, Mirko; Jovanović, Vladimir; Suligoj, Tomislav
Suppression of Corner Effects in Triple-Gate Bulk FinFETs // Proceedings of the International IEEE Conference EUROCON 2009 / Mironenko, I. ; Mikerov, A. (ur.).
Sankt Peterburg: Institute of Electrical and Electronics Engineers (IEEE), 2009. str. 1-6 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)

CROSBI ID: 401695 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
Suppression of Corner Effects in Triple-Gate Bulk FinFETs

Autori
Poljak, Mirko ; Jovanović, Vladimir ; Suligoj, Tomislav

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
Proceedings of the International IEEE Conference EUROCON 2009 / Mironenko, I. ; Mikerov, A. - Sankt Peterburg : Institute of Electrical and Electronics Engineers (IEEE), 2009, 1-6

ISBN
978-1-4244-3861-7

Skup
International IEEE Conference EUROCON 2009

Mjesto i datum
Sankt Peterburg, Ruska Federacija, 18.05.2009. - 23.05.2009

Vrsta sudjelovanja
Poster

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
bulk; corner effect; kink effect; FinFET; implantation; short-channel effects

Sažetak
This paper presents a method of suppressing kink effects which originate in the corners of triple-gate bulk FinFETs. We propose corner implantation to turn off the parasitic corner device which has lower threshold voltage than the bulk device. This method is investigated in triple-gate bulk FinFETs by 3D numerical simulations. Threshold voltage shift of 0.434 V with a decrease in on-state current of only 23% is achieved, while the kink effect in devices' current-voltage characteristics is completely eliminated. Corner implantation improves devices' immunity to short-channel effects.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika



POVEZANOST RADA

Projekti:
036-0361566-1567 - Nanometarski elektronički elementi i sklopovske primjene (Suligoj, Tomislav, MZO ) ( CroRIS)
036-0982904-1642 - Sofisticirane poluvodičke strukture za komunikacijsku tehnologiju (Koričić, Marko, MZO ) ( CroRIS)

Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb

Profili:

Avatar Url Vladimir Jovanović (autor)

Avatar Url Tomislav Suligoj (autor)

Avatar Url Mirko Poljak (autor)

Citiraj ovu publikaciju:

Poljak, Mirko; Jovanović, Vladimir; Suligoj, Tomislav
Suppression of Corner Effects in Triple-Gate Bulk FinFETs // Proceedings of the International IEEE Conference EUROCON 2009 / Mironenko, I. ; Mikerov, A. (ur.).
Sankt Peterburg: Institute of Electrical and Electronics Engineers (IEEE), 2009. str. 1-6 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
Poljak, M., Jovanović, V. & Suligoj, T. (2009) Suppression of Corner Effects in Triple-Gate Bulk FinFETs. U: Mironenko, I. & Mikerov, A. (ur.)Proceedings of the International IEEE Conference EUROCON 2009.
@article{article, author = {Poljak, Mirko and Jovanovi\'{c}, Vladimir and Suligoj, Tomislav}, year = {2009}, pages = {1-6}, keywords = {bulk, corner effect, kink effect, FinFET, implantation, short-channel effects}, isbn = {978-1-4244-3861-7}, title = {Suppression of Corner Effects in Triple-Gate Bulk FinFETs}, keyword = {bulk, corner effect, kink effect, FinFET, implantation, short-channel effects}, publisher = {Institute of Electrical and Electronics Engineers (IEEE)}, publisherplace = {Sankt Peterburg, Ruska Federacija} }
@article{article, author = {Poljak, Mirko and Jovanovi\'{c}, Vladimir and Suligoj, Tomislav}, year = {2009}, pages = {1-6}, keywords = {bulk, corner effect, kink effect, FinFET, implantation, short-channel effects}, isbn = {978-1-4244-3861-7}, title = {Suppression of Corner Effects in Triple-Gate Bulk FinFETs}, keyword = {bulk, corner effect, kink effect, FinFET, implantation, short-channel effects}, publisher = {Institute of Electrical and Electronics Engineers (IEEE)}, publisherplace = {Sankt Peterburg, Ruska Federacija} }

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