Pregled bibliografske jedinice broj: 377617
Surface characterization of carbon-tungsten alloys prepared by reactive sputtering
Surface characterization of carbon-tungsten alloys prepared by reactive sputtering // E-MRS 2008 Spring Meeting BOOK OF ABSTRACTS
Strasbourg, 2008. str. x-x (predavanje, međunarodna recenzija, sažetak, znanstveni)
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Naslov
Surface characterization of carbon-tungsten alloys prepared by reactive sputtering
Autori
Radić, Nikola ; Dubček, Pavo ; Ristić, Mira ; Musić, Svetozar ; Tonejc, Antun ; Bernstorff, Sigrid
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
E-MRS 2008 Spring Meeting BOOK OF ABSTRACTS
/ - Strasbourg, 2008, X-x
Skup
E-MRS 2008 Spring Meeting, Symposium A: Carbon-based nanostructured composite films
Mjesto i datum
Strasbourg, Francuska, 26.05.2008. - 30.05.2008
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
carbon-tungsten alloys ; reactive sputtering ; surface characterization
Sažetak
The surface features of tungsten-carbon thin films, deposited onto monocrystalline silicon substrates by reactive magnetron sputtering (argon + benzene) has been investigated by GISAXS, AFM and SEM. Benzene partial pressure was varied from 1% to 10% of the total working gas pressure in order to produce W-C films with variable fraction of incorporated unbound carbon. A series of samples were prepared, with the substrate temperature held at RT, 200°C, and 400°C, and the substrate potential held at floating potential or biased -70 V with respect to discharge plasma. Structure of the films is found to be nanocrystalline to amorphous WC1-x as the carbon content increase, with a fine dispersion of DLC-clusters imbedded between nanograins. The GISAXS analysis revealed the particle size of about 3 nm within the films. The same results indicate that the surface of the examined films is rather smooth - surface roughness is about 0, 5 nm, with a very short inplane height-height correlation length. The AFM measurements and SEM results are employed to characterize the surface and subsurface layer of the films, in order to examine a degree of bulk structure propagation to the surface.
Izvorni jezik
Engleski
Znanstvena područja
Fizika, Kemija
POVEZANOST RADA
Projekti:
098-0982886-2895 - Novi amorfni i nanostrukturirani tankoslojni materijali (Radić, Nikola, MZOS ) ( CroRIS)
098-0982904-2952 - Sinteza i mikrostruktura metalnih oksida i oksidnih stakala (Ristić, Mira, MZOS ) ( CroRIS)
119-0982886-1009 - Struktura i svojstva posebnih nanomaterijala dobivenih suvremenim tehnikama (Tonejc, Antun, MZOS ) ( CroRIS)
098-0982886-2866 - Temeljna svojstva nanostruktura i defekata u poluvodičima i dielektricima (Pivac, Branko, MZOS ) ( CroRIS)
Ustanove:
Institut "Ruđer Bošković", Zagreb,
Prirodoslovno-matematički fakultet, Zagreb
Profili:
Pavo Dubček
(autor)
Mira Ristić
(autor)
Antun Tonejc
(autor)
Svetozar Musić
(autor)
Nikola Radić
(autor)