Naslov
X-ray tracing study of crystall spectrometers for WDXRS application

Autori
Tadić, Tonči ; Jakšić, Milko ; Božičević, Iva

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni

Izvornik
Book of Abstracts / Fazinić, S. ; Jakšić, M. - Zagreb : Institrut Ruđer Bošković, 2008

Skup
European Conference on X-Ray Spectrometry

Mjesto i datum
Cavtat, Hrvatska, 16.06.2008. - 20.06.2008

Vrsta sudjelovanja
Poster

Vrsta recenzije
Nije recenziran

Ključne riječi
X-ray tracing study; WDXRS

Sažetak
Construction of wavelength-dispersive crystal X-ray spectrometer, used in high resolution wavelength dispersion X-ray emission spectroscopy (WDXRS), may result in geometrical aberrations, such are systematic X-ray line shifts and changes of the X-ray line shape. Most of these aberrations can be reduced by a careful design of a crystal spectrometer, maintaining efficiency of the spectrometer as high as possible. Since experimental investigation of impact of WDX spectrometer design on aberrations is difficult, a numerical X-ray tracing procedure has been applied for this purpose, with output in the form of a 2-dimensional virtual X-ray intensity array on the detector surface or in the form of virtual X-ray energy spectrum.

Izvorni jezik
Engleski

Znanstvena područja
Fizika

POVEZANOST RADA