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Pregled bibliografske jedinice broj: 370074

Structural properties of transparent conductive oxides by x-ray spectroscopy


Gracin, Davor; Belić Domagoj; Juraić, Krunoslav; Ristova, Mimoza; Georgijeva, Verka; Djerdj, Igor; Tomašić, Nenad
Structural properties of transparent conductive oxides by x-ray spectroscopy // 7th Conference of the Society of Physicists of Macedonia, Book of Abstracts / ? (ur.).
Skopje: Society of Physicists of Macedonia, 2008. str. 34-34 (predavanje, nije recenziran, sažetak, znanstveni)


CROSBI ID: 370074 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
Structural properties of transparent conductive oxides by x-ray spectroscopy

Autori
Gracin, Davor ; Belić Domagoj ; Juraić, Krunoslav ; Ristova, Mimoza ; Georgijeva, Verka ; Djerdj, Igor ; Tomašić, Nenad

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni

Izvornik
7th Conference of the Society of Physicists of Macedonia, Book of Abstracts / ? - Skopje : Society of Physicists of Macedonia, 2008, 34-34

Skup
7th Conference of the Society of Physicists of Macedonia

Mjesto i datum
Ohrid, Sjeverna Makedonija, 18.09.2008. - 21.09.2008

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Nije recenziran

Ključne riječi
transparent conductive oxides; x-ray spectroscopy

Sažetak
Transparent conductive oxides are interesting materials, in particularly as front contacts in thin film solar cells. Theirs structural properties as crystallinity, individual crystal sizes, surface roughness and strain determinates optical and electrical properties. In order to explore the correlation between optical and electrical properties with structure, as well as influence of deposition condition on growth and structure, it is important to know the structural data as accurate as possible. The samples, thin SnOx and ZnOx films on glass, were deposited by chemical vapour deposition and electro-chemical deposition under various deposition conditions. When using x-ray diffraction (XRD) as tool for structural analysis, the conventional set-up for measurements was used. In analysis of crystal size, two main approaches were used. In first approach, the size of crystals was estimated used Scherer formula while. In second type of analysis the fact that line broadening is consequence of several contributions will be used in estimation the crystal size, individual size distribution and strain by Rietveld refinement and "Breath" method. The results all of applied methods were compared and accuracy as well as suitability each of methods in thin film analysis was discussed. Structural properties were correlated with electrical and optical properties and in some extend with characteristics of deposition methods.

Izvorni jezik
Engleski

Znanstvena područja
Fizika, Geologija



POVEZANOST RADA


Projekti:
098-0982886-2894 - Tanki filmovi legura silicija na prijelazu iz amorfne u uređenu strukturu (Gracin, Davor, MZOS ) ( CroRIS)
119-0000000-1158 - Međudjelovanje minerala i okoliša (Bermanec, Vladimir, MZOS ) ( CroRIS)

Ustanove:
Institut "Ruđer Bošković", Zagreb,
Prirodoslovno-matematički fakultet, Zagreb

Profili:

Avatar Url Nenad Tomašić (autor)

Avatar Url Davor Gracin (autor)

Avatar Url Igor Đerđ (autor)

Avatar Url Krunoslav Juraić (autor)


Citiraj ovu publikaciju:

Gracin, Davor; Belić Domagoj; Juraić, Krunoslav; Ristova, Mimoza; Georgijeva, Verka; Djerdj, Igor; Tomašić, Nenad
Structural properties of transparent conductive oxides by x-ray spectroscopy // 7th Conference of the Society of Physicists of Macedonia, Book of Abstracts / ? (ur.).
Skopje: Society of Physicists of Macedonia, 2008. str. 34-34 (predavanje, nije recenziran, sažetak, znanstveni)
Gracin, D., Belić Domagoj, Juraić, K., Ristova, M., Georgijeva, V., Djerdj, I. & Tomašić, N. (2008) Structural properties of transparent conductive oxides by x-ray spectroscopy. U: ? (ur.)7th Conference of the Society of Physicists of Macedonia, Book of Abstracts.
@article{article, author = {Gracin, Davor and Jurai\'{c}, Krunoslav and Ristova, Mimoza and Georgijeva, Verka and Djerdj, Igor and Toma\v{s}i\'{c}, Nenad}, year = {2008}, pages = {34-34}, keywords = {transparent conductive oxides, x-ray spectroscopy}, title = {Structural properties of transparent conductive oxides by x-ray spectroscopy}, keyword = {transparent conductive oxides, x-ray spectroscopy}, publisher = {Society of Physicists of Macedonia}, publisherplace = {Ohrid, Sjeverna Makedonija} }
@article{article, author = {Gracin, Davor and Jurai\'{c}, Krunoslav and Ristova, Mimoza and Georgijeva, Verka and Djerdj, Igor and Toma\v{s}i\'{c}, Nenad}, year = {2008}, pages = {34-34}, keywords = {transparent conductive oxides, x-ray spectroscopy}, title = {Structural properties of transparent conductive oxides by x-ray spectroscopy}, keyword = {transparent conductive oxides, x-ray spectroscopy}, publisher = {Society of Physicists of Macedonia}, publisherplace = {Ohrid, Sjeverna Makedonija} }




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