Pregled bibliografske jedinice broj: 367067
Transport Properties of the Ta<sub>x</sub>N thin films
Transport Properties of the TaxN thin films // ARW Workshop on Properties and Applications of Thermoelectric Materials & Conference on Concepts in Electron Correlation
Hvar, Hrvatska, 2008. (poster, nije recenziran, sažetak, znanstveni)
CROSBI ID: 367067 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Transport Properties of the Ta<sub>x</sub>N thin films
Autori
Očko, Miroslav ; Žonja, Sanja ; Yu, Lei
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Skup
ARW Workshop on Properties and Applications of Thermoelectric Materials & Conference on Concepts in Electron Correlation
Mjesto i datum
Hvar, Hrvatska, 20.09.2008. - 30.09.2008
Vrsta sudjelovanja
Poster
Vrsta recenzije
Nije recenziran
Ključne riječi
Ta<sub>x</sub>N thin films; resistivity; thermopower
Sažetak
We report on the low temperature transport properties of the Ta<sub>x</sub>N thin films deposited on the SiO<sub>2</sub> amorphous substrate. The results were analyzed in the light of the Ta<sub>x</sub>N thin films investigations deposited on the sapphire substrate where <i>x</i> varied from 1.2 to 0.4 spanning thus the critical concentration of the metal.insulator transition at <i>x</i> = 0.6. During the deposition on the low cost SiO<sub>2</sub> amorphous substrate, the substrates were held at the same temperature, 450 <sup>o</sup>C, at partial N<sub>2</sub> pressures ranging from 50 to 100 mTorr. Thus we obtain the Ta<sub>x</sub>N thin film alloys in a narrow range of <i>x</i>: 0.72-0.83. The transport properties show considerable and non monotonous variation with <i>x</i>, which we attribute to the local minimum in the density of the electronic states at Fermi level of the rock salt intermetallic Ta<sub>4</sub>N<sub>5</sub>. The temperature dependences of the resistivities, which we fit to exp(<i>T</i>/<i>T</i><sub>0</sub>), are also discussed.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Projekti:
035-0352827-2841 - Materijali sa elektronskom strukturom modeliranom modernim tehnikama priprave (Aviani, Ivica, MZOS ) ( CroRIS)
036-0982904-1642 - Sofisticirane poluvodičke strukture za komunikacijsku tehnologiju (Koričić, Marko, MZO ) ( CroRIS)
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb,
Institut za filozofiju, Zagreb
