Pregled bibliografske jedinice broj: 36614
High-energy resolution PIXE study of heat induced changes in cadmium compounds using ion microbeam
High-energy resolution PIXE study of heat induced changes in cadmium compounds using ion microbeam // Nuclear instruments & methods in physics research - section B : beam interactions with materials and atoms, 158 (1999), 1-4; 241-244 (međunarodna recenzija, članak, znanstveni)
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Naslov
High-energy resolution PIXE study of heat induced changes in cadmium compounds using ion microbeam
Autori
Tadić, Tonči ; Mokuno, Y. ; Horino, Y. ; Jakšić, Milko ; Desnica-Franković, Dunja Ida ; Trojko, Rudolf
Izvornik
Nuclear instruments & methods in physics research - section B : beam interactions with materials and atoms (0168-583X) 158
(1999), 1-4;
241-244
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Sažetak
The intensity changes of satellite X-ray line spectra can be related to the changes in the chemical environment of atoms in the sample. High-energy resolution PIXE analysis of chemical effects in X-ray spectra of Cd L lines was applied in studies of heat-treated CdS and CdTe cadmium compounds. The applicability of the method for monitoring crystal phases and chemical states in these and other materials using ion microbeam with high energy resolution PIXE spectrometer is discussed.
Izvorni jezik
Engleski
Znanstvena područja
Fizika, Kemija
POVEZANOST RADA
Ustanove:
Institut "Ruđer Bošković", Zagreb
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
