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Pregled bibliografske jedinice broj: 323997

Comparison of fractal and profilometric methods for surface topography characterization


Mahović Poljaček, Sanja; Risović, Dubravko; Furić, Krešimir; Gojo, Miroslav
Comparison of fractal and profilometric methods for surface topography characterization // Applied Surface Science, 254 (2008), 11; 3449-3458 (međunarodna recenzija, članak, znanstveni)


CROSBI ID: 323997 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
Comparison of fractal and profilometric methods for surface topography characterization

Autori
Mahović Poljaček, Sanja ; Risović, Dubravko ; Furić, Krešimir ; Gojo, Miroslav

Izvornik
Applied Surface Science (0169-4332) 254 (2008), 11; 3449-3458

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
aluminium oxide film; microporous surfaces; profilometry; fractal analysis

Sažetak
In this study micro-structural and roughness characterization of surface of aluminium foils used in lithographic printing process was performed by contact and non-contact profilometric methods and fractal analysis. Significant differences in roughness parameters values inferred from stylus method in respect to those inferred from the non-contact measurements were observed. The investigation of correlation between various fractal dimensions obtained from gray scale SEM micrographs and binary images resulting from median filtering of the original SEM micrographs as well as selected relevant roughness parameters shows that there is a strong correlation between certain roughness parameters and particular fractal dimensions. This correlations permit better physical understanding of fractal characteristics and interpretation of the dynamics of surface roughness change through processing. Generally these correlations are more suitable for parameters obtained by stylus method than those inferred from the laser-based measurements.

Izvorni jezik
Engleski

Znanstvena područja
Fizika, Grafička tehnologija, Kemijsko inženjerstvo



POVEZANOST RADA


Projekti:
098-0982904-2898 - Fizika i primjena nanostruktura i volumne tvari (Ivanda, Mile, MZOS ) ( CroRIS)
098-0982915-2899 - Organizacijski procesi i optičke interakcije u kondenziranim molekulskim sistemi (Risović, Dubravko, MZOS ) ( CroRIS)
128-1201785-2228 - Razvoj metoda mjerenja površina tiskovnih formi (Gojo, Miroslav, MZOS ) ( CroRIS)
128-1281957-1958 - Digitalizacija muzejske slikarske baštine (Agić, Darko, MZOS ) ( CroRIS)

Ustanove:
Institut "Ruđer Bošković", Zagreb,
Grafički fakultet, Zagreb

Citiraj ovu publikaciju:

Mahović Poljaček, Sanja; Risović, Dubravko; Furić, Krešimir; Gojo, Miroslav
Comparison of fractal and profilometric methods for surface topography characterization // Applied Surface Science, 254 (2008), 11; 3449-3458 (međunarodna recenzija, članak, znanstveni)
Mahović Poljaček, S., Risović, D., Furić, K. & Gojo, M. (2008) Comparison of fractal and profilometric methods for surface topography characterization. Applied Surface Science, 254 (11), 3449-3458.
@article{article, author = {Mahovi\'{c} Polja\v{c}ek, Sanja and Risovi\'{c}, Dubravko and Furi\'{c}, Kre\v{s}imir and Gojo, Miroslav}, year = {2008}, pages = {3449-3458}, keywords = {aluminium oxide film, microporous surfaces, profilometry, fractal analysis}, journal = {Applied Surface Science}, volume = {254}, number = {11}, issn = {0169-4332}, title = {Comparison of fractal and profilometric methods for surface topography characterization}, keyword = {aluminium oxide film, microporous surfaces, profilometry, fractal analysis} }
@article{article, author = {Mahovi\'{c} Polja\v{c}ek, Sanja and Risovi\'{c}, Dubravko and Furi\'{c}, Kre\v{s}imir and Gojo, Miroslav}, year = {2008}, pages = {3449-3458}, keywords = {aluminium oxide film, microporous surfaces, profilometry, fractal analysis}, journal = {Applied Surface Science}, volume = {254}, number = {11}, issn = {0169-4332}, title = {Comparison of fractal and profilometric methods for surface topography characterization}, keyword = {aluminium oxide film, microporous surfaces, profilometry, fractal analysis} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


Uključenost u ostale bibliografske baze podataka::


  • INSPEC
  • Scopus





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