Pregled bibliografske jedinice broj: 316752
Ion beam synthesis of buried Zn-VI quantum dots in SiO2 - grazing incidence small-angle X-ray scattering studies
Ion beam synthesis of buried Zn-VI quantum dots in SiO2 - grazing incidence small-angle X-ray scattering studies // Journal of applied crystallography, 36 (2003), 3; 439-442 (međunarodna recenzija, članak, znanstveni)
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Naslov
Ion beam synthesis of buried Zn-VI quantum dots in
SiO2 - grazing incidence small-angle X-ray
scattering studies
Autori
Desnica-Franković, Dunja ; Desnica, Uroš ; Dubček, Pavo ; Buljan, Maja ; Bernstorff, Sigrid ; Karl, H. ; Großhans, Ingo ; Stritzker, B. ;
Izvornik
Journal of applied crystallography (0021-8898) 36
(2003), 3;
439-442
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
grazing incidence ; small-angle X-ray scattering ; ion implantation ; nano-particles ; quantum dots ; ZnS ; ZnTe
Sažetak
Grazing incidence small-angle X-ray scattering was used to study ion-beam synthesized Zn-VI compound- semiconductor quantum dots (QDs), buried in a SiO2 matrix. The ZnTe and ZnS QDs were formed by successive ion implantation of constituent atoms, at high ion doses and subsequent annealing at different temperatures in the 1070-1370 K range. In Zn and Te implanted SiO2, small nano-crystals were formed at higher annealing-temperatures, a bimodal size distribution of nano-particles was observed for both materials, which could be explained by an interplay of Ostwald ripening and enhanced diffusion in the irradiation-damaged region.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
Uključenost u ostale bibliografske baze podataka::
- The INSPEC Science Abstracts series