Pregled bibliografske jedinice broj: 316731
Grazing incidence small-angle X-ray scattering studies of the synthesis and growth of CdS quantum dots from constituent atoms in SiO2 matrix
Grazing incidence small-angle X-ray scattering studies of the synthesis and growth of CdS quantum dots from constituent atoms in SiO2 matrix // Journal of applied crystallography, 36 (2003), 443-446 doi:10.1107/S0021889803000529 (međunarodna recenzija, članak, znanstveni)
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Naslov
Grazing incidence small-angle X-ray scattering
studies of the synthesis and growth of CdS quantum
dots from constituent atoms in SiO2 matrix
Autori
Desnica, Uroš ; Dubček, Pavo ; Desnica-Franković, Dunja ; Buljan, Maja ; Bernstorff, Sigrid ; White, C. W.
Izvornik
Journal of applied crystallography (0021-8898) 36
(2003);
443-446
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
nanocrystals ; quantum dots ; X-ray scattering ; SAXS ; GISAXS ; implantation ; CdS
Sažetak
Grazing incidence small angle X-ray scattering was applied to study the synthesis and growth of CdS quantum dots (QDs) from Cd and S atoms implanted in SiO2. For a dose of 1017/cm2, the partial synthesis of CdS QDs occurred already during implantation, with only moderate size increase upon subsequent annealing up to Ta=1073 K. The dynamics of QD synthesis and growth were considerably different already for two times lower dose, where synthesis started only after annealing at Ta = 773 K, with a strong increase of the size of QDs upon annealing at higher Ta. Results suggest that high-dose implantation followed by low-T annealing could lead to better defined sizes and narrower size distributions of QDs.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
Uključenost u ostale bibliografske baze podataka::
- The INSPEC Science Abstracts series