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Pregled bibliografske jedinice broj: 307716

Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties

Gajović, Andreja; Gracin, Davor; Djerdj, Igor; Tomašić, Nenad; Juraić, Krunoslav; Su, Dang Sheng
Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties // Applied surface science, 254 (2008), 9; 2748-2754 doi:10.1016/j.apsusc.2007.10.014 (međunarodna recenzija, članak, znanstveni)

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Naslov
Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties

Autori
Gajović, Andreja ; Gracin, Davor ; Djerdj, Igor ; Tomašić, Nenad ; Juraić, Krunoslav ; Su, Dang Sheng

Izvornik
Applied surface science (0169-4332) 254 (2008), 9; 2748-2754

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
silicon ; solar cells ; nanostructures ; optical properties

Sažetak
A series of thin silicon films with different degrees of crystallinity were prepared by decomposition of silane gas highly diluted with hydrogen, in radiofrequency glow discharge. The crystallite size, shape, and the portion of crystalline phase were investigated by high-resolution transmission electron microscopy (HRTEM), selected-area electron diffraction (SAED), Raman spectroscopy (RS), and X-ray powder diffraction (XRD). The absorption coefficient ( ) was calculated from the measurement of UV-VIS-transmittance. By using RS, the volume fractions of the crystalline phase were estimated from the ratio of the integrated intensities of transversal optical (TO)-related crystalline and amorphous bands. These results were in excellent agreement with the mean crystallite sizes measured in HRTEM images and crystallite sizes refined from XRD measurements. The red shift of absorption, appearing as a result of the increase of the crystal fraction, depends on the size and distribution of nanocrystals.

Izvorni jezik
Engleski

Znanstvena područja
Fizika, Geologija



POVEZANOST RADA

Projekti:
098-0982886-2894 - Tanki filmovi legura silicija na prijelazu iz amorfne u uređenu strukturu (Gracin, Davor, MZOS ) ( CroRIS)
098-0982904-2898 - Fizika i primjena nanostruktura i volumne tvari (Ivanda, Mile, MZOS ) ( CroRIS)
119-0000000-1158 - Međudjelovanje minerala i okoliša (Bermanec, Vladimir, MZOS ) ( CroRIS)

Ustanove:
Institut "Ruđer Bošković", Zagreb,
Prirodoslovno-matematički fakultet, Zagreb

Profili:

Avatar Url Krunoslav Juraić (autor)

Avatar Url Andreja Gajović (autor)

Avatar Url Davor Gracin (autor)

Avatar Url Nenad Tomašić (autor)

Avatar Url Igor Đerđ (autor)

Poveznice na cjeloviti tekst rada:

doi www.sciencedirect.com doi.org

Citiraj ovu publikaciju:

Gajović, Andreja; Gracin, Davor; Djerdj, Igor; Tomašić, Nenad; Juraić, Krunoslav; Su, Dang Sheng
Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties // Applied surface science, 254 (2008), 9; 2748-2754 doi:10.1016/j.apsusc.2007.10.014 (međunarodna recenzija, članak, znanstveni)
Gajović, A., Gracin, D., Djerdj, I., Tomašić, N., Juraić, K. & Su, D. (2008) Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties. Applied surface science, 254 (9), 2748-2754 doi:10.1016/j.apsusc.2007.10.014.
@article{article, author = {Gajovi\'{c}, Andreja and Gracin, Davor and Djerdj, Igor and Toma\v{s}i\'{c}, Nenad and Jurai\'{c}, Krunoslav and Su, Dang Sheng}, year = {2008}, pages = {2748-2754}, DOI = {10.1016/j.apsusc.2007.10.014}, keywords = {silicon, solar cells, nanostructures, optical properties}, journal = {Applied surface science}, doi = {10.1016/j.apsusc.2007.10.014}, volume = {254}, number = {9}, issn = {0169-4332}, title = {Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties}, keyword = {silicon, solar cells, nanostructures, optical properties} }
@article{article, author = {Gajovi\'{c}, Andreja and Gracin, Davor and Djerdj, Igor and Toma\v{s}i\'{c}, Nenad and Jurai\'{c}, Krunoslav and Su, Dang Sheng}, year = {2008}, pages = {2748-2754}, DOI = {10.1016/j.apsusc.2007.10.014}, keywords = {silicon, solar cells, nanostructures, optical properties}, journal = {Applied surface science}, doi = {10.1016/j.apsusc.2007.10.014}, volume = {254}, number = {9}, issn = {0169-4332}, title = {Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties}, keyword = {silicon, solar cells, nanostructures, optical properties} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus

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