Pregled bibliografske jedinice broj: 303516
Determination of refractive index of a-Si1-xCx:H thin films from infrared absorption spectra
Determination of refractive index of a-Si1-xCx:H thin films from infrared absorption spectra // Applied optics, 32 (1993), 7; 1173-1175 doi:10.1364/AO.32.001173 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 303516 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Determination of refractive index of a-Si1-xCx:H thin films from infrared absorption spectra
Autori
Lugomer, Stjepan ; Maksimović, Aleksandar ; Gracin, Davor
Izvornik
Applied optics (0003-6935) 32
(1993), 7;
1173-1175
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
amorphous silicon carbide ; effective index of refraction ; optical properties ; IR absorption measurements
Sažetak
The index of refractiion of A-Si1-xCx:H thin films obtained by magnetron sputtering was determined by means of IR absorption measurements. Structural and compositional changes that take place by increasing x make the film a mixture of different species, giving an effective value of the refractive index.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Ustanove:
Institut "Ruđer Bošković", Zagreb
Citiraj ovu publikaciju:
Časopis indeksira:
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
- MEDLINE
