Pregled bibliografske jedinice broj: 297662
Direct observation of defect levels in InN by soft x-ray absorption
Direct observation of defect levels in InN by soft x-ray absorption // Journal of Physical Chemistry B, 110 (2006), 7; 2984-2987 doi:10.1021/jp057140l (međunarodna recenzija, članak, znanstveni)
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Naslov
Direct observation of defect levels in InN by soft x-ray absorption
Autori
Petravić, Mladen ; Deenapanray, P. N. K. ; Fraser, M. D. ; Soldatov, A. V. ; Yang, Y.-W. ; Anderson, P. A. ; Durbin, S. M.
Izvornik
Journal of Physical Chemistry B (1520-6106) 110
(2006), 7;
2984-2987
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
fine-structure; thin-films; band-gap; nitride
Sažetak
We have used synchrotron-based near-edge X-ray absorption fine structure (NEXAFS) spectroscopy to study the electronic structure of nitrogen-related defects in InN(0001). Several defect levels within the band gap or the conduction band of InN were clearly resolved in NEXAFS spectra around the nitrogen K- edge. We attribute the level observed at 0.3 eV below the conduction band minimum (CBM) to interstitial nitrogen, the level at 1.7 eV above the CBM to antisite nitrogen, and a sharp resonance at 3.2 eV above the CBM to molecular nitrogen, in full agreement with theoretical simulations.
Izvorni jezik
Engleski
Znanstvena područja
Fizika, Kemija
POVEZANOST RADA
Projekti:
316-0982886-0542 - Istraživanje dušikovih defekata u složenim poluvodičkim spojevima (Petravić, Mladen, MZOS ) ( CroRIS)
Ustanove:
Filozofski fakultet, Rijeka
Profili:
Mladen Petravić
(autor)
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
- MEDLINE