Pregled bibliografske jedinice broj: 293993
Semiquantitative X-ray diffraction method for phase analysis using additions of a foreign component
Semiquantitative X-ray diffraction method for phase analysis using additions of a foreign component // Journal of applied crystallography, 18 (1985), 80-84 doi:10.1107/S0021889885009876 (međunarodna recenzija, članak, znanstveni)
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Naslov
Semiquantitative X-ray diffraction method for phase
analysis using additions of a foreign component
Autori
Gržeta, Biserka ; Popović, Stanko
Izvornik
Journal of applied crystallography (0021-8898) 18
(1985);
80-84
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
X-ray diffraction ; quantitative phase analysis
Sažetak
A method is described for semiquantitative X.ray diffraction phase analysis, which involves the addition to the investigated multicomponent system of known large (about 80-95%) amounts of a crystalline substance originally not contained in the system. This results in a decrease of the diffraction line intensities of the components to be measured to small but detectable values. The wiight fraction of a component is related to the added fraction of the doping substance and to the fraction of the component remaining in the doped sample. The method is very simple and yields the weight fractions of the major components in the system with a typical error of a few percent. The weight fractions of the minor components cannot be determined with fair accuracy in this way. The method is appropriate in cases where only a small amount of the investigated system is available. Optimum conditions to attain maximum accuracy of the methodare discussesd.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Ustanove:
Institut "Ruđer Bošković", Zagreb
Citiraj ovu publikaciju:
Časopis indeksira:
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus