Pregled bibliografske jedinice broj: 293979
Low-temperature X-ray diffraction examination of In2Se3
Low-temperature X-ray diffraction examination of In2Se3 // Journal of applied crystallography, 23 (1990), 340-341 doi:10.1107/S0021889890002710 (međunarodna recenzija, članak, znanstveni)
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Naslov
Low-temperature X-ray diffraction examination of In2Se3
Autori
Gržeta, Biserka ; Popović, Stanko ; Cowlam, Neil ; Čelustka, Branko
Izvornik
Journal of applied crystallography (0021-8898) 23
(1990);
340-341
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
indium selenide ; thermal expansion at low temperature ; X-ray diffraction
Sažetak
Indium selenide, In_2Se_3, has been examined by X-ray diffraction in the temperature interval from 300 to 5 K. Coefficients of thermal expansion for the rhombohedral alpha- In_2Se_3 phase in the low- temperature range have been determined and the appearance of the new phase at temperature below ~160 K was confirmed.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Ustanove:
Institut "Ruđer Bošković", Zagreb,
Medicinski fakultet, Zagreb
Citiraj ovu publikaciju:
Časopis indeksira:
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus