Pregled bibliografske jedinice broj: 292115
Reducing phase retrieval errors in Fourier analysis of 2-dimensional digital model interferograms
Reducing phase retrieval errors in Fourier analysis of 2-dimensional digital model interferograms // Optics and Lasers in Engineering, 45 (2007), 8; 868-876 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 292115 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Reducing phase retrieval errors in Fourier analysis of 2-dimensional digital model interferograms
Autori
Gladić, Jadranko ; Vučić, Zlatko ; Lovrić, Davorin
Izvornik
Optics and Lasers in Engineering (0143-8166) 45
(2007), 8;
868-876
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
digital image processing; fringe analysis; phase retrieval; crystal growth
Sažetak
In order to measure the displacements of facets on a growing spherical Cu2-δ Se crystal with subnanometre resolution, we investigated the reliability and accuracy of standard method of Fourier analysis of digital laser interferograms. Guided by the realistic experimental conditions (two-dimensional (2D) interferograms), starting from 2D model interferograms and using original custom designed Gaussian filtering window and multistage unwrapping procedure of the retrieved phase, we demonstrate for a considerable parameter range the non-neglibible inherent phase retrieval error due to non-integer number of fringes within the digital image. Our results indicate an intermediate parameter range where the error is acceptably small. We introduce an algorithm modification that significantly reduces the error, especially for low and high fringe densities. In the experimentally most common case of diagonal fringes the reduced error is an order of magnitude smaller than for nearly one-dimensional case within almost entire parameter space.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus