Pregled bibliografske jedinice broj: 288210
Determination of grain sizes and porosity in nanophase vanadium oxide and V/Ce oxides via GISAX, GIWXD and GIXR techniques
Determination of grain sizes and porosity in nanophase vanadium oxide and V/Ce oxides via GISAX, GIWXD and GIXR techniques, 2006. (izvještaj).
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Naslov
Determination of grain sizes and porosity in nanophase vanadium oxide and V/Ce oxides via GISAX, GIWXD and GIXR techniques
Autori
Turković, Aleksandra ; Lučić-Lavčevć, Magdy ; Dubček, Pavo ; Pavlović, Mladen ; Bernstorff, Sigrid
Izvornik
Austrian SAXS beamline at Elettra annual report 2005
Vrsta, podvrsta
Ostale vrste radova, izvještaj
Godina
2006
Ključne riječi
vanadium oxide; GISAX; GIWXD and GIXR techniques
Sažetak
The present study shows that the application of the particle scattering model in analyzing GISAXS measurements data can be utilized for estimating the structural properties of the vanadium/cerium oxide thin films as well as for following their structural modifications in the process of lithium intercalation. However, since SAXS analysis is model-dependent and suffers from the influence of various material properties, a two dimensional detection of the scattering signal is applied and the results are compared to those of the AFM surface imaging. In conclusion, the observed aspects of the GISAXS intensity maps supported by the AFM analysis provide a contribution to the modeling of nanostructured intercalation electrodes.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
