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Pregled bibliografske jedinice broj: 270598

Defect structure examination of Sn-doped indium oxide (ITO)


Popović, Jasminka; Tkalčec, Emilija; Gržeta, Biserka; Goebbert, Christian; Ksenofontov, Vadim; Takeda, Masuo
Defect structure examination of Sn-doped indium oxide (ITO) // Book of Abstracts. 10th European Powder Diffraction Conference / Černy, Radovan (ur.).
Ženeva: University of Geneva, 2006. str. 26-26 (pozvano predavanje, međunarodna recenzija, sažetak, znanstveni)


CROSBI ID: 270598 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
Defect structure examination of Sn-doped indium oxide (ITO)

Autori
Popović, Jasminka ; Tkalčec, Emilija ; Gržeta, Biserka ; Goebbert, Christian ; Ksenofontov, Vadim ; Takeda, Masuo

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni

Izvornik
Book of Abstracts. 10th European Powder Diffraction Conference / Černy, Radovan - Ženeva : University of Geneva, 2006, 26-26

Skup
10th European Powder Diffraction Conference

Mjesto i datum
Ženeva, Švicarska, 01.09.2006. - 04.09.2006

Vrsta sudjelovanja
Pozvano predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
indium tin oxide (ITO); X-ray powder diffraction; Moessbauer spectroscopy; Rietveld method

Sažetak
Tin doped indium oxide (ITO) is one of the most commonly used transparent conducting oxides (TCOs). It is used in various commercial applications: transparent electrodes in solar collectors and solar cells, transparent heating elements for aircraft windows, for antistatic coating on instrument windows and in production of flat-panel displays. However, the structure of ITO is not completely understood yet, nor the correlation between the structure and its properties. In_2O_3 crystallizes in Ia-3 space group. It is isostructural with mineral bixbyite. The structure possesses two octahedral cation sites, denoted as B and D sites. Structural changes in indium oxide lattice due to doping with tin were studied by X-ray powder diffraction. The local environment of tin in ITO was investigated by ^(119)Sn Mössbauer spectroscopy. Nanocrystalline ITO samples containing 0-14 at% Sn were prepared by a sol-gel technique from InCl_3 and SnCl_4, followed by thermal treatment at 300 oC for 2 h. Diffraction patterns confirmed the In_2O_3-type structure. Diffraction lines were broadened, the line broadening increased with tin content. Unit-cell parameter was determined by UNITCELL program and refined by WPPF program. Unit-cell parameter increased with tin doping level up to 8 at% Sn and decreased above. Such behavior of the unit-cell parameter indicated that tin substitution for indium on sites B and D is non-uniform and is dependent on tin content. ^(119)Sn Mössbauer spectra showed that tin is present only in Sn^(4+) state in the samples. The best fits of ^(119)Sn Mössbauer spectra were obtained by assuming the presence of two doublets, corresponding to Sn^(4+) on B and D sites of the original In_2O_3 structure. The pronounced difference was observed in the relative area of the two doublets. The ratio of relative area of component D over relative area of component B decreased with the increase in tin content. For the sample containing 8 at% Sn this ratio was equal to unity. It was supposed that non-uniform tin occupation of sites B and D influenced crystallite sizes and lattice strain for ITO, so the analysis of diffraction line broadening was undertaken. Size-strain line-broadening analysis showed that crystallite sizes decreased and strain increased with increasing tin content.

Izvorni jezik
Engleski

Znanstvena područja
Fizika, Kemija



POVEZANOST RADA


Projekti:
0098067

Ustanove:
Institut "Ruđer Bošković", Zagreb


Citiraj ovu publikaciju:

Popović, Jasminka; Tkalčec, Emilija; Gržeta, Biserka; Goebbert, Christian; Ksenofontov, Vadim; Takeda, Masuo
Defect structure examination of Sn-doped indium oxide (ITO) // Book of Abstracts. 10th European Powder Diffraction Conference / Černy, Radovan (ur.).
Ženeva: University of Geneva, 2006. str. 26-26 (pozvano predavanje, međunarodna recenzija, sažetak, znanstveni)
Popović, J., Tkalčec, E., Gržeta, B., Goebbert, C., Ksenofontov, V. & Takeda, M. (2006) Defect structure examination of Sn-doped indium oxide (ITO). U: Černy, R. (ur.)Book of Abstracts. 10th European Powder Diffraction Conference.
@article{article, author = {Popovi\'{c}, Jasminka and Tkal\v{c}ec, Emilija and Gr\v{z}eta, Biserka and Goebbert, Christian and Ksenofontov, Vadim and Takeda, Masuo}, editor = {\v{C}erny, R.}, year = {2006}, pages = {26-26}, keywords = {indium tin oxide (ITO), X-ray powder diffraction, Moessbauer spectroscopy, Rietveld method}, title = {Defect structure examination of Sn-doped indium oxide (ITO)}, keyword = {indium tin oxide (ITO), X-ray powder diffraction, Moessbauer spectroscopy, Rietveld method}, publisher = {University of Geneva}, publisherplace = {\v{Z}eneva, \v{S}vicarska} }
@article{article, author = {Popovi\'{c}, Jasminka and Tkal\v{c}ec, Emilija and Gr\v{z}eta, Biserka and Goebbert, Christian and Ksenofontov, Vadim and Takeda, Masuo}, editor = {\v{C}erny, R.}, year = {2006}, pages = {26-26}, keywords = {indium tin oxide (ITO), X-ray powder diffraction, Moessbauer spectroscopy, Rietveld method}, title = {Defect structure examination of Sn-doped indium oxide (ITO)}, keyword = {indium tin oxide (ITO), X-ray powder diffraction, Moessbauer spectroscopy, Rietveld method}, publisher = {University of Geneva}, publisherplace = {\v{Z}eneva, \v{S}vicarska} }




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