Pregled bibliografske jedinice broj: 263951
Low Pressure Chemical Vapour Deposition of Silicon and Silicon Dioxide Thin Films for Thin Thermal Heater
Low Pressure Chemical Vapour Deposition of Silicon and Silicon Dioxide Thin Films for Thin Thermal Heater // 42nd International conference on microelectronics, device and materials and the workshop on MEMS and NEMS : proceedimngs / Vrtačnik, D. ; Amon, S. ; Šorli I. (ur.).
Ljubljana: Society for Microelectronics, Electronic Components and Materials (MIDEM), 2006. str. 297-302 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
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Naslov
Low Pressure Chemical Vapour Deposition of Silicon and Silicon Dioxide Thin Films for Thin Thermal Heater
Autori
Žonja, Sanja ; Biljanović, Petar ; Ivanda, Mile ; Gebavi, Hrvoje ; Ristić, Davor ; Furić, Krešimir ; Musić, Svetozar ; Ristić, Mira ; Gamulin, Ozren
Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni
Izvornik
42nd International conference on microelectronics, device and materials and the workshop on MEMS and NEMS : proceedimngs
/ Vrtačnik, D. ; Amon, S. ; Šorli I. - Ljubljana : Society for Microelectronics, Electronic Components and Materials (MIDEM), 2006, 297-302
Skup
International conference on microelectronics, device and materials and the workshop on MEMS and NEMS (42 ; 2006)
Mjesto i datum
Strahinj, Slovenija, 13.09.2006. - 15.09.2006
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
LPCVD thermal heater
Sažetak
Low pressure chemical vapour deposition was used to deposit different silicon and silicon dioxide structures for thin film thermal heater by varying the working gas composition and substrate temperature. Silane gas diluted with argon was used to deposit silicon layers on different temperatures between 600 ^oC and 900 ^oC. BCl_3 was used for doping of polycrystalline silicon films to assure desirable resistivity values. The SiO_2 layers were prepared by wet oxidation in thermal diffusion reactor. Raman and IR spectroscopy, SEM and AFM analysis and electrical measurements were used for examining the structure and optical properties of prepared layers.
Izvorni jezik
Engleski
Znanstvena područja
Fizika, Elektrotehnika
POVEZANOST RADA
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb,
Institut "Ruđer Bošković", Zagreb
Profili:
Mira Ristić
(autor)
Svetozar Musić
(autor)
Petar Biljanović
(autor)
Mile Ivanda
(autor)
Krešimir Furić
(autor)
Sanja Žonja
(autor)
Hrvoje Gebavi
(autor)
Ozren Gamulin
(autor)
Davor Ristić
(autor)