Pretražite po imenu i prezimenu autora, mentora, urednika, prevoditelja

Napredna pretraga

Pregled bibliografske jedinice broj: 250968

A BVCEO Engineering in Horizontal Current Bipolar Transistor (HCBT) Technology


Suligoj, Tomislav; Koričić, Marko; Biljanović, Petar
A BVCEO Engineering in Horizontal Current Bipolar Transistor (HCBT) Technology // Proceedings of MELECON 2006
Málaga, Španjolska, 2006. str. 137-140 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)


CROSBI ID: 250968 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
A BVCEO Engineering in Horizontal Current Bipolar Transistor (HCBT) Technology

Autori
Suligoj, Tomislav ; Koričić, Marko ; Biljanović, Petar

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
Proceedings of MELECON 2006 / - , 2006, 137-140

Skup
13^th Mediterranean Electrotechnical Conference MELECON 2006

Mjesto i datum
Málaga, Španjolska, 16.05.2006. - 19.05.2006

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
HCBT; extrinsic base; charge sharing effect; BVCEO; BVCBO; speed breakdown tradeoff

Sažetak
A need for different breakdown voltages of verticalcurrent bipolar transistors on the same chip is accomplished by added process complexity and increased fabrication costs. In Horizontal Current Bipolar Transistor (HCBT) technology, the devices with different collector-emitter breakdown voltages (BVCEO) can be fabricated just by changing the mask dimensions, without any addition to process flow. Extrinsic base has a main effect on BVCEO due to charge sharing effect. Cutoff frequency and maximum frequency of oscillations of HCBT structures with different extrinsic base widths are measured together with BVCEO. The optimum fTBVCEO product of more than 100 GHzV is achieved at extrinsic base width of 0.8 μ m. The charge sharing effect is analyzed by 2D simulations and the reduction of the peak electric field in the intrinsic region is shown. Moreover, the increase of BVCEO at low base currents is measured and explained by the current gain reduction due to SHR recombination in emitter-base depletion region. The breakdown occurs in different regions of HCBT structure at low and high currents.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika



POVEZANOST RADA


Projekti:
0036001

Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb

Profili:

Avatar Url Marko Koričić (autor)

Avatar Url Petar Biljanović (autor)

Avatar Url Tomislav Suligoj (autor)


Citiraj ovu publikaciju:

Suligoj, Tomislav; Koričić, Marko; Biljanović, Petar
A BVCEO Engineering in Horizontal Current Bipolar Transistor (HCBT) Technology // Proceedings of MELECON 2006
Málaga, Španjolska, 2006. str. 137-140 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
Suligoj, T., Koričić, M. & Biljanović, P. (2006) A BVCEO Engineering in Horizontal Current Bipolar Transistor (HCBT) Technology. U: Proceedings of MELECON 2006.
@article{article, author = {Suligoj, Tomislav and Kori\v{c}i\'{c}, Marko and Biljanovi\'{c}, Petar}, year = {2006}, pages = {137-140}, keywords = {HCBT, extrinsic base, charge sharing effect, BVCEO, BVCBO, speed breakdown tradeoff}, title = {A BVCEO Engineering in Horizontal Current Bipolar Transistor (HCBT) Technology}, keyword = {HCBT, extrinsic base, charge sharing effect, BVCEO, BVCBO, speed breakdown tradeoff}, publisherplace = {M\'{a}laga, \v{S}panjolska} }
@article{article, author = {Suligoj, Tomislav and Kori\v{c}i\'{c}, Marko and Biljanovi\'{c}, Petar}, year = {2006}, pages = {137-140}, keywords = {HCBT, extrinsic base, charge sharing effect, BVCEO, BVCBO, speed breakdown tradeoff}, title = {A BVCEO Engineering in Horizontal Current Bipolar Transistor (HCBT) Technology}, keyword = {HCBT, extrinsic base, charge sharing effect, BVCEO, BVCBO, speed breakdown tradeoff}, publisherplace = {M\'{a}laga, \v{S}panjolska} }




Contrast
Increase Font
Decrease Font
Dyslexic Font