Pregled bibliografske jedinice broj: 203775
Influence of stoichiometry deviations on properties of ion-beam synthesized CdSe QDs
Influence of stoichiometry deviations on properties of ion-beam synthesized CdSe QDs // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 238 (2005), 302-305 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 203775 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Influence of stoichiometry deviations on properties of ion-beam synthesized CdSe QDs
Autori
Desnica-Franković, Ida-Dunja ; Dubček, Pavo ; Buljan, Maja ; Furić, Krešimir ; Desnica, Uroš ; Bernstorff, Sigrid ; Karl, Helmut ; Grosshans, Ingo ; Stritzker, Bern
Izvornik
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (0168-583X) 238
(2005);
302-305
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
nanocrystals; quantum dots; X-ray scattering; GISAXS; implantation; CdSe
Sažetak
CdSe quantum dots (QDs) were synthesized by ion-implanting constituent atoms in SiO2, thermally grown on Si-wafer. The influence of implantation and post-implantation treatment parameters was studied by grazing incidence small angle scattering of X-rays (GISAXS). The effect of stoichiometry deviations was analyzed for various Cd:Se ratios in the range of 0.75 to 1.95. The best correlated ensemble of QDs in implanted layer was found for 1.33 and 1.1 Cd:Se ratios, and 30 s post-implant annealing at 700 oC. These findings were related with the amount of well-crystallized CdSe QDs, as found by Raman scattering.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Ustanove:
Institut "Ruđer Bošković", Zagreb
Profili:
Uroš Desnica
(autor)
Maja Mičetić
(autor)
Pavo Dubček
(autor)
Ida-Dunja Desnica
(autor)
Krešimir Furić
(autor)
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
Uključenost u ostale bibliografske baze podataka::
- The INSPEC Science Abstracts series