Naslov
GISAXS View of Vanadium Cerium Oxide Thin Films and Influence of Lithium Intercalation

Autori
Lučić Lavčević, Magdy ; Dubček, Pavo ; Crnjak Orel, Zorica ; Turković, Aleksandra

Izvornik
Journal of chemical information and modeling (1549-9596) 45(6) (2005); 1553-1557

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
GISAXS; Thin films; V/Ce-oxide; Dip-coating

Sažetak
Examination of structural modifications, induced by mixing vanadium and cerium oxides and by introduction of lithium in vanadium and mixed vanadium/cerium oxide films, was performed using synchrotron sourced grazing incidence small angle X-ray scattering. Samples were sol-gel derived films, deposited by dip-coating technique. Analysis of the scattering data, acquired by two-dimensional detection system, is based on the comparison of the surface and bulk characteristics of the film. The trend of estimated structural modifications is supported by the results of previous investigations on different length scale, performed by atomic force microscopy.

Izvorni jezik
Engleski

Znanstvena područja
Fizika

Napomena
Objavljen na web-u: 25.10.2005.

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