Pregled bibliografske jedinice broj: 150731
The nano-structural properties of hydrogenated silicon-carbon alloys by optical methods
The nano-structural properties of hydrogenated silicon-carbon alloys by optical methods // Book 1: Plenary and Parallel Sessions of 16th IVC, 12th ICSS, 8th NANO & 17th AIV / Borello, G.P. ; Campani, M. (ur.).
Venecija: Asociate Italiana del Vuoto ; International Union for Vacuum Science, Technique and Aplications (IUVSTA), 2004. str. 518-518 (predavanje, međunarodna recenzija, sažetak, znanstveni)
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Naslov
The nano-structural properties of hydrogenated silicon-carbon alloys by optical methods
Autori
Gracin, Davor ; Juraić, Krunoslav ; Dubček, Pavo ; Bogdanović Radović, Ivančica ; Gajović, Andreja ; Bernstorff, Sigrid
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
Book 1: Plenary and Parallel Sessions of 16th IVC, 12th ICSS, 8th NANO & 17th AIV
/ Borello, G.P. ; Campani, M. - Venecija : Asociate Italiana del Vuoto ; International Union for Vacuum Science, Technique and Aplications (IUVSTA), 2004, 518-518
Skup
16th International Vacuum Congress, 12th International Conference on Surface Science, 8th International Conference on Nanometer-Scale Science and Technology, 17th Vacuum National Symposium
Mjesto i datum
Venecija, Italija, 28.06.2004. - 02.07.2004
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
silicon carbide; nanoparticles; SAXS; FTIRaman; RBS; ERDA
(silicon carbide; nanoparticles; GISAXS; FTIRaman; RBS; ERDA)
Sažetak
Amorphous hydrogenated silicon-carbon thin films were deposited by sputtering of silicon target in gas mixture containing hydrogen and carbon atoms, with extensive variation in hydrogen content and carbon to silicon ratio. The composition of specimens and theirs structural ordering on atom level was estimated by IBA (Ion Beam Analysis), e.g. RBS (Rutherford Back Scattering) and ERDA (Elastic Recoil Detection Analysis), FTIR (Fourier Transform Infrared) and Raman spectroscopy. The spectral distribution of dielectric function was estimated upon standard transmittance and reflectance measurements in uv-visible part of the spectrum. The homogeneity of deposited films on nano-scale was examined by GISAXS (Grazing Incidence Small Angle X-ray Scattering), performed on ELETTRA synchrotron radiation source, Trieste (Italy). Results of GISAXS spectra of all of measured specimens indicate presence of "particles" in the "bulk" of the films, with size distribution between 1 and 2 nm and mean values variation between 1 and 6 nm. In order to determine the constitution of the "particles", the specimens were modelled as a multy-component material with certain dimensions and certain optical properties for each of component, considering the results of all of applied methods. The possibilities of this kind of analysis have been discussed on several typical examples.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Ustanove:
Institut "Ruđer Bošković", Zagreb
Profili:
Krunoslav Juraić
(autor)
Pavo Dubček
(autor)
Andreja Gajović
(autor)
Ivančica Bogdanović Radović
(autor)
Davor Gracin
(autor)