Pregled bibliografske jedinice broj: 143385
Impedance spectroscopy and GISAXS on nanostructured TiO2 films
Impedance spectroscopy and GISAXS on nanostructured TiO2 films // Ctatalogue of Posters, EuroNanoForum 2003, European and International Forum on Nanotechnology, Trieate (Italy), 9-12 December 2003 / Sfiligoj, Antonio (ur.).
Trst: Europska komisija, 2003. (poster, međunarodna recenzija, sažetak, znanstveni)
CROSBI ID: 143385 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Impedance spectroscopy and GISAXS on nanostructured TiO2 films
Autori
Turković, Aleksandra ; Gaberšček, Miran
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
Ctatalogue of Posters, EuroNanoForum 2003, European and International Forum on Nanotechnology, Trieate (Italy), 9-12 December 2003
/ Sfiligoj, Antonio - Trst : Europska komisija, 2003
Skup
EuroNanoForum 2003, European and International Forum on Nanotechnology, Trieate (Italy), 9-12 December 2003
Mjesto i datum
Trst, Italija, 09.12.2003. - 12.12.2003
Vrsta sudjelovanja
Poster
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
GISAXS; Impedance spectroscopy; TiO2
Sažetak
Films containing nanosized grains of titanium dioxide (TiO2) are widely used in research into mainly optical, photovoltaic, photochromic and electrochromic devices. In most cases there is a desirable average grain size [1], but also a desirable porosity of TiO2. Films of titanium dioxide derived by organic sol-gel route were investigated by transmission electron microscopy [2]. It shows them as polydispersed and porous, with nanometer sized grains. Samples were characterised by impedance spectroscopy (IS). Measurements by grazing-incidence small-angle X-ray scattering (GISAXS) [3] showed that grain sizes vary with the thickness of the films. We have found the dependence of electrical resistivity measured by impedance spectroscopy on the grain sizes in nanostructured films of TiO2. The experiment was done in the range of film˘s thickness from 200 Å ; ; ; to 1200 Å ; ; ; . Porosity for these films thickness is constant and expressed by internal specific surface equals Ss= 1 nm-1. References [1] Hagfeldt A, Grätzel M. Chem.Rev. 1995 ; 95/1:40. [2] Tonejc AM, Gotić M, Gržeta B, Musić S, Popović S, Trojko R, Turković A, Mušević I, Materials Science & Engineering B 1996 ; 40:177. [3] Lučić-Lavčević M, Dubček P, Milat O, Etlinger B, Turković A, Šokčević D, Amenitsch H, Materials Letters 1998 ; 36: 56.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
