Naslov
Synchrotron light scattering on nanostructured V/Ce oxide films with Li+ ions

Autori
Dubček, Pavo ; Turković, Aleksandra ; Crnjak Orel, Zorica ; Etlinger, Božidar ; Bernstdorff, Sigrid

Izvornik
Journal of Chemical Information & Computer Sciences (0095-2338) 44 (2004), 2; 290-295

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
GIXR; GISAXS; Thin films; V/Ce-oxide; Dip-coating

Sažetak
Vanadium oxide and new V/Ce oxide films on glass substrate were obtained by sol-gel process. The morphology of these nanostructured and porous films was studied by grazing-incidence small-angle X-ray scattering (GISAXS) at the ELETTRA synchrotron (Italy, Trieste). The aim of performing GISAXS was to study changes, which might occur in grain sizes and porosity of vanadium oxide and V/Ce oxide at 38 and 55 at. % of V, upon the intercalation of Li+ ions. The average grain radius <R> obtained by GISAXS varied with the layer thickness and upon intercalation of Li+ ions. Layer structure in V/Ce oxides was revealed by grazing-incidence X-ray reflectivity (GIXR) method. The average grain radius <R>, obtained by GISAXS was correlated intercalation of Li+ ions. The specific surface area of these films was also determined and generally varied from 0.5 nm-1 to 0.03 nm-1.

Izvorni jezik
Engleski

Znanstvena područja
Fizika

POVEZANOST RADA