Pregled bibliografske jedinice broj: 12543
On the Accuracy of the Statistical Data Analysis in Optoelectronic Time Jitter Testing
On the Accuracy of the Statistical Data Analysis in Optoelectronic Time Jitter Testing // Proceedings WDTA '98 / Kovač, Mario (ur.).
Zagreb: Fakultet elektrotehnike i računarstva Sveučilišta u Zagrebu, 1998. str. 167-170 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
CROSBI ID: 12543 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
On the Accuracy of the Statistical Data Analysis in Optoelectronic Time Jitter Testing
Autori
Medved Rogina, Branka
Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni
Izvornik
Proceedings WDTA '98
/ Kovač, Mario - Zagreb : Fakultet elektrotehnike i računarstva Sveučilišta u Zagrebu, 1998, 167-170
Skup
1st International Workshop on Design, Test and Applications WDTA '98
Mjesto i datum
Dubrovnik, Hrvatska, 08.06.1998. - 10.06.1998
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
statistical; data analysis; time; jitter; optoelectronic
Sažetak
The accuracy of parameters determined from the statistical approach to experimental data has been analysed. Two main procedures for estimating parameters of random variable are discussed. The confidence interval method includes the probability that the result falls within that interval. Another approach uses sample values as estimators for parameters of random variable. The results of statistical data analysis have been used in the optoelectronic time jitter testing, to improve the accuracy of nanosecond time interval measurements in the time-of-flight measuring system. That obtained the single-shot time resolution of 40 ps.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika
POVEZANOST RADA
Projekti:
00980502
Ustanove:
Institut "Ruđer Bošković", Zagreb
Profili:
Branka Medved-Rogina
(autor)
