Naslov
Application of the effective medium theory for optical modelling of the composite thin films

Autori
Čakara, Duško

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni

Izvornik
CEEC-PCMS1 Book of abstracts / Erceg, Matko ; Rotar, Andrei ; Vrsalovic , Ladislav - , 2022, 69-69

ISBN
978-606-11-8164-3

Skup
1th Central and Eastern European Conference on Physical Chemistry and Materials Science (CEEC-PCMS1)

Mjesto i datum
Split, Hrvatska, 26.07.2022. - 30.07.2022

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
dielectric function ; model ; spectroscopic ellipsometry ; mixture ; optics

Sažetak
Spectroscopic ellipsometry is widely used for experimental determination of the dielectric function and thickness of thin films on reflective surfaces. The technique is featured with many advantages such as being fast, non-invasive and applicable in a broad range of environments, both in- and ex-situ. However, the interpretation of ellipsometric spectra resides on optical models, in which the dielectric functions (DF) of all materials constituting the surface interface with the medium, plays the central role. On the other hand, the DF determines the macroscopically observable optoelectronic properties of materials, important for their applications. Heterogeneous materials, composed of more than one chemical phase, for which the dielectric function has to be modelled according to the meso-scale structure of optical components, are commonly present in functional (composite) thin films. Up to present days, optical modelling of such materials presents a major scientific challenge. The available approaches reside either on the effective medium theory, or very robust computer simulations. The former approach involves postulation of the composition and structure of the optical phases and approximations that are not generally applicable, thus needs to be validated for each specific system. The paper revises some applications of the effective medium theory for modelling the ellipsometrically measured reflection coefficients of composite thin films, enriched by the recent in-house results of fitting the effective medium DFs for several morphologically different classes of samples: heterogeneous thin films formed by the oxidation of metal (Cu, Zn) surfaces in a chloride solution, in the presence and absence of several organic corrosion inhibitors [1, 2], as well as the polymer brushes grafted at the Si/SiO2 surface and loaded with gold nanoparticles [3]

Izvorni jezik
Engleski

Znanstvena područja
Fizika, Kemija, Interdisciplinarne prirodne znanosti

POVEZANOST RADA