Naslov
LASER SYNTHESIS OF SILVER, GOLD, AND PLATINUM DOPED ZINC OXIDE NANOPARTICLES

Autori
Radičić, Rafaela ; Maletić, Dejan ; Blažeka, Damjan ; Krce, Lucija ; Aviani, Ivica ; Krstulović, Nikša

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni

Izvornik
6. Simpozij studenata doktorskih studija PMF-a / - , 2022, 74-75

Skup
6. Simpozij studenata doktorskih studija PMF-a = 6th Faculty of Science PhD Student Symposium

Mjesto i datum
Zagreb, Hrvatska, 23.04.2022. - 24.04.2022

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Recenziran

Ključne riječi
ZnO, pulsed laser ablation, pulsed laser deposition, doping, Pt, Au, Ag, nanoparticles

Sažetak
In nanoscience and nanotechnology, nanoparticles have a significant role due to their unique magnetic, electrical, mechanical, optical, and electronic properties with respect to the bulk materials [1]. Zinc oxide (ZnO) is one of the most widely used materials with unique physicochemical properties and direct band-gap energy of 3.37 eV [2]. Introducing a new element in the crystal structure of ZnO leads to enhancement of the electrical and optical properties and broadens the area of its application [3]. Pulsed laser ablation in liquid (PLAL) gained a lot of attention due to the simplicity, effectiveness, high purity, and fast production of nanoparticles [4], while a wide range of parameters can be optimized [5, 6]. In this work, a simple two-step method for the synthesis of silver (Ag), gold (Au), and platinum (Pt) doped ZnO nanoparticles have been developed. The method is based on the fabrication of targets using pulsed laser deposition (PLD) technique where thin layers of metals (Ag, Pt, Au) have been deposited on a ZnO substrate. Such formed two-layer structures were used as a target for the production of doped nanoparticles (ZnO: Ag, ZnO: Au, and ZnO: Pt) by pulsed laser ablation in water. The optical properties, crystalline structure, elemental composition, morphology, and nanoparticle size distribution were studied using UV-VIS spectrophotometer, Xray diffraction (XRD), X-ray spectroscopy (XPS), scanning electron microscope (SEM), and atomic force microscope (AFM), respectively.

Izvorni jezik
Engleski

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