Pretražite po imenu i prezimenu autora, mentora, urednika, prevoditelja

Napredna pretraga

Pregled bibliografske jedinice broj: 121011

UV light induced defects in amorphous silicon thin films


Pivac, Branko; Pavlović, Mladen; Kovačević, Ivana; Etlinger, Božidar; Zulim, Ivan
UV light induced defects in amorphous silicon thin films // Vacuum, 71 (2003), 135-139 (međunarodna recenzija, članak, znanstveni)


CROSBI ID: 121011 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
UV light induced defects in amorphous silicon thin films

Autori
Pivac, Branko ; Pavlović, Mladen ; Kovačević, Ivana ; Etlinger, Božidar ; Zulim, Ivan

Izvornik
Vacuum (0042-207X) 71 (2003); 135-139

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
silicon; defects; oxygen; deep level transient spectroscopy; photoconductivity

Sažetak
The effect of light soaking on a-Si:H films is well known as Staebler-Wronski effect, though its complete mechanism is not clear yet. We have studied the effect of light soaking with UV light on intrinsic a-Si:H films, as well as the effect of thermal annealing in the dark. It is shown that the light soaking of the films in the air did not affect hydrogen concentration from Si-H bonds and at same time oxidation of the films is observed. It means that oxygen incorporation was due to broken backbonds to Si-H which are very likely weak bonds. Moreover it is found that UV irradiation produced oxidation and caused even minor Si-H bonds breaking.

Izvorni jezik
Engleski

Znanstvena područja
Fizika, Elektrotehnika



POVEZANOST RADA


Projekti:
0098140
0023004
0098020

Ustanove:
Fakultet elektrotehnike, strojarstva i brodogradnje, Split,
Institut "Ruđer Bošković", Zagreb

Profili:

Avatar Url Ivan Zulim (autor)

Avatar Url Branko Pivac (autor)

Avatar Url Božidar Etlinger (autor)

Avatar Url Mladen Pavlović (autor)

Avatar Url Ivana Capan (autor)


Citiraj ovu publikaciju:

Pivac, Branko; Pavlović, Mladen; Kovačević, Ivana; Etlinger, Božidar; Zulim, Ivan
UV light induced defects in amorphous silicon thin films // Vacuum, 71 (2003), 135-139 (međunarodna recenzija, članak, znanstveni)
Pivac, B., Pavlović, M., Kovačević, I., Etlinger, B. & Zulim, I. (2003) UV light induced defects in amorphous silicon thin films. Vacuum, 71, 135-139.
@article{article, author = {Pivac, Branko and Pavlovi\'{c}, Mladen and Kova\v{c}evi\'{c}, Ivana and Etlinger, Bo\v{z}idar and Zulim, Ivan}, year = {2003}, pages = {135-139}, keywords = {silicon, defects, oxygen, deep level transient spectroscopy, photoconductivity}, journal = {Vacuum}, volume = {71}, issn = {0042-207X}, title = {UV light induced defects in amorphous silicon thin films}, keyword = {silicon, defects, oxygen, deep level transient spectroscopy, photoconductivity} }
@article{article, author = {Pivac, Branko and Pavlovi\'{c}, Mladen and Kova\v{c}evi\'{c}, Ivana and Etlinger, Bo\v{z}idar and Zulim, Ivan}, year = {2003}, pages = {135-139}, keywords = {silicon, defects, oxygen, deep level transient spectroscopy, photoconductivity}, journal = {Vacuum}, volume = {71}, issn = {0042-207X}, title = {UV light induced defects in amorphous silicon thin films}, keyword = {silicon, defects, oxygen, deep level transient spectroscopy, photoconductivity} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus





Contrast
Increase Font
Decrease Font
Dyslexic Font