Pregled bibliografske jedinice broj: 121011
UV light induced defects in amorphous silicon thin films
UV light induced defects in amorphous silicon thin films // Vacuum, 71 (2003), 135-139 (međunarodna recenzija, članak, znanstveni)
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Naslov
UV light induced defects in amorphous silicon thin films
Autori
Pivac, Branko ; Pavlović, Mladen ; Kovačević, Ivana ; Etlinger, Božidar ; Zulim, Ivan
Izvornik
Vacuum (0042-207X) 71
(2003);
135-139
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
silicon; defects; oxygen; deep level transient spectroscopy; photoconductivity
Sažetak
The effect of light soaking on a-Si:H films is well known as Staebler-Wronski effect, though its complete mechanism is not clear yet. We have studied the effect of light soaking with UV light on intrinsic a-Si:H films, as well as the effect of thermal annealing in the dark. It is shown that the light soaking of the films in the air did not affect hydrogen concentration from Si-H bonds and at same time oxidation of the films is observed. It means that oxygen incorporation was due to broken backbonds to Si-H which are very likely weak bonds. Moreover it is found that UV irradiation produced oxidation and caused even minor Si-H bonds breaking.
Izvorni jezik
Engleski
Znanstvena područja
Fizika, Elektrotehnika
POVEZANOST RADA
Ustanove:
Fakultet elektrotehnike, strojarstva i brodogradnje, Split,
Institut "Ruđer Bošković", Zagreb
Profili:
Ivan Zulim
(autor)
Branko Pivac
(autor)
Božidar Etlinger
(autor)
Mladen Pavlović
(autor)
Ivana Capan
(autor)
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus