Pregled bibliografske jedinice broj: 1182783
Reflection dependence of microwave carrier lifetime measurements in semiconductors
Reflection dependence of microwave carrier lifetime measurements in semiconductors, 1962. (ostalo).
CROSBI ID: 1182783 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Reflection dependence of microwave carrier lifetime
measurements in semiconductors
Autori
Galogaža, Vladimir ; Herak, Janko
Vrsta, podvrsta
Ostale vrste radova, ostalo
Godina
1962
Ključne riječi
semiconductors , microwave measurement, lifetime of excited charge carriers
Sažetak
The methods of lifetime measurements of the excess charge carriers after excitation is presented. The method does not require particular shape or electric contacts to the sample studied.
Izvorni jezik
Engleski
Napomena
Rad je znanstveni. objavljen u časopisu, koje je
davno prestao izlaziti.
i
