Naslov
ADVANCED IN-SITU ELECTRON MICROSCOPY ANALYSIS OF THE NANOSTRUCTURED SEMICONDUCTING ZINCITE THIN-FILMS

Autori
Mandić, Vilko ; Panžić, Ivana ; Wurmshubr, Michael ; Kiener, Daniel

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, ostalo

Skup
27. hrvatski skup kemičara i kemijskih inženjera (27HSKIKI)

Mjesto i datum
Veli Lošinj, Hrvatska, 05.10.2021. - 08.10.2021

Vrsta sudjelovanja
Pozvano predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
ZnO thin films, FIB, in situ, mechanical testing

Sažetak
Zincite semiconductors show high electron mobility and large exciton binding energy [1]. Recently it was shown zincite films can be prepared prepare in low-dimensional configurations. Overcoming challenges of describing such films reveals just how much such 1D configuration can be desirable for boosting materials physical properties such as the charge transfer efficiency. Synthetic wise, powerful physical deposition techniques often require demanding conditions while some chemical processing can enable large-scale fabrication at mild temperatures, such as such chemical bath route for growth of well-aligned zincite nanorods [2]. For characterisation purpose, conventional methods struggle to fully reveal the investigated material, whereas a more detailed insight in some material characteristics, particularly in the nanoscale regime, asks for a more sophisticated approach. Here we synthesised 1D nanostructured zincite thin-films on different substrates. We show their structure-performance behaviour with advanced imaging techniques. Specifically, we focus on the in-situ micromechanical experiments with advanced analysis techniques (such as nanoindentation) under various conditions during scanning electron microscopy (in situ SEM). The course of characterisation was assisted by focused ion beam (FIB) based material preparation and structuring as well as digital image correlation techniques to observe, describe and understand the occurrence of local deformations and generally microstructural evolution. We were able to conduct a miniaturised fracture testing within the electron microscope and nanoindenter. Results were utilised to qualify and quantify the materials resistance to mechanical failure such as undesirable cracking events dependant on the chosen synthesis parameters. The mitigation of such events should enable major development role of the nanoscale optoelectronic devices especially on conductive flexible substrates beneficial for high performance photovoltaics.

Izvorni jezik
Engleski

Znanstvena područja
Kemija, Kemijsko inženjerstvo

POVEZANOST RADA