Pregled bibliografske jedinice broj: 1142614
Ellipsometry-based study of glass refractive index depth profiles obtained by applying different poling conditions
Ellipsometry-based study of glass refractive index depth profiles obtained by applying different poling conditions // Applied optics, 59 (2020), 5; A69-A74 (međunarodna recenzija, članak, znanstveni)
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Naslov
Ellipsometry-based study of glass refractive
index depth profiles obtained by applying
different poling conditions
Autori
Fabijanić, Ivana ; Pervan, Petar ; Okorn, Boris ; Sancho-Parramon, Jordi ; Janicki, Vesna
Izvornik
Applied optics (0003-6935) 59
(2020), 5;
A69-A74
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
EFAD
Sažetak
Application of electric field and moderately elevated temperature depletes the side facing anode from alkali present in glasses. The change of composition of the treated glass results in variation of refractive index depth profile within the treated glass. Spectroscopic ellipsometry is employed for characterization of optical properties of glass treated in different conditions. The results of optical characterization are verified by secondary ion mass spectroscopy. It is found that the refractive index profile obtained from ellipsometry has a maximum value higher than the one of untreated glass. The obtained refractive index profiles are in very good agreement with concentration profiles
Izvorni jezik
Engleski
Znanstvena područja
Fizika, Kemija, Elektrotehnika
POVEZANOST RADA
Projekti:
HRZZ-IP-2016-06-2168 - Razlaganje električnim poljem u tankim optičkim slojevima - nanostrukturiranje, dopiranje, porozni slojevi (REPTOSNANODOPS) (Janicki, Vesna, HRZZ - 2016-06) ( CroRIS)
Ustanove:
Institut "Ruđer Bošković", Zagreb
Profili:
Vesna Janicki
(autor)
Petar Pervan
(autor)
Jordi Sancho Parramon
(autor)
Boris Okorn
(autor)
Ivana Fabijanić
(autor)
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
- MEDLINE