Pregled bibliografske jedinice broj: 1089666
On the Many Applications of Nanometer-Thin Pure Boron Layers in IC and Microelectromechanical Systems Technology
On the Many Applications of Nanometer-Thin Pure Boron Layers in IC and Microelectromechanical Systems Technology // Journal of nanoscience and nanotechnology, 21 (2021), 4; 2472-2482 doi:10.1166/jnn.2021.19112 (međunarodna recenzija, članak, znanstveni)
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Naslov
On the Many Applications of Nanometer-Thin Pure
Boron Layers in IC and Microelectromechanical
Systems Technology
Autori
Nanver, L. K. ; Knezevic, Tihomir ; Liu, X. ; Thammaiah, S. D. ; Krakers, M. ;
Izvornik
Journal of nanoscience and nanotechnology (1533-4880) 21
(2021), 4;
2472-2482
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
Pure Boron, Chemical Vapor Deposition (CVD), Molecular Beam Epitaxy (MBE), Photodiodes, Silicon Micromachining
Sažetak
An overview is given of the many applications that nm-thin pure boron (PureB) layers can have when deposited on semiconductors such as Si, Ge, and GaN. The application that has been researched in most detail is the fabrication of nm-shallow p+n-like Si diode junctions that are both electrically and chemically very robust. They are presently used commercially in photodiode detectors for extremeultraviolet (EUV) lithography and scanning-electron- microscopy (SEM) systems. By using chemicalvapor deposition (CVD) or molecular beam epitaxy (MBE) to deposit the B, PureB diodes have been fabricated at temperatures from an optimal 700 .C to as low as 50 .C, making them both front- and back-end-of-line CMOS compatible. On Ge, near-ideal p+n-like diodes were fabricated by covering a wetting layer of Ga with a PureB capping layer (PureGaB). For GaN high electron mobility transistors (HEMTs), an Al-on-PureB gate stack was developed that promises to be a robust alternative to the conventional Ni-Au gates. In MEMS processing, PureB is a resilient nm-thin masking layer for Si micromachining with tetramethyl ammonium hydroxide (TMAH) or potassium hydroxide (KOH), and low-stress PureB membranes have also been demonstrated.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika
POVEZANOST RADA
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb
Profili:
Tihomir Knežević
(autor)
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- MEDLINE