Pregled bibliografske jedinice broj: 1059933
Evolution of electric field assisted dissolution of nanoparticles investigated by spectroscopic ellipsometry
Evolution of electric field assisted dissolution of nanoparticles investigated by spectroscopic ellipsometry // Optical materials, 101 (2020), 109752, 8 doi:10.1016/j.optmat.2020.109752 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 1059933 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Evolution of electric field assisted dissolution of nanoparticles investigated by spectroscopic ellipsometry
Autori
Okorn, Boris ; Sancho-Parramon, Jordi ; Pervan, Petar ; Fabijanić, Ivana ; Janicki, Vesna
Izvornik
Optical materials (0925-3467) 101
(2020);
109752, 8
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
electric field assisted dissolution ; metal nanoparticles ; spectroscopic ellipsometry ; localized surface plasmon resonance ; refractive index gradient
Sažetak
The evolution of electric field assisted dissolution (EFAD) of nanoparticles process is studied by means of spectroscopic ellipsometry. Multilayer structures with embedded Ag islands flms are prepared by electron beam evaporation and subjected to EFAD process using different voltages and treatment times. Modelling of ellipsometric data evidences the dissolution process by the progressive quenching of the localized surface plasmon resonance of nanoparticles. Further quantitative information is revealed by the analysis of the effective dielectric function of Ag islands films in terms of the spectral density function. The amount of dissolved metal appears to follow a non-linear dependence with the applied voltage. Ag islands become elongated in the film plane as dissolution takes place. In the case of multiple Ag islands films, the process takes place in a sequential way, starting from the film closest to the glass substrate. Accumulation of Ag in a near-surface glass region is revealed by the presence of a refractive index gradient. Overall, the study demonstrates the usefulness of ellipsometry for providing novel insights into the EFAD process.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Projekti:
HRZZ-IP-2016-06-2168 - Razlaganje električnim poljem u tankim optičkim slojevima - nanostrukturiranje, dopiranje, porozni slojevi (REPTOSNANODOPS) (Janicki, Vesna, HRZZ - 2016-06) ( CroRIS)
Ustanove:
Institut "Ruđer Bošković", Zagreb
Profili:
Vesna Janicki
(autor)
Petar Pervan
(autor)
Jordi Sancho Parramon
(autor)
Ivana Fabijanić
(autor)
Boris Okorn
(autor)
Poveznice na cjeloviti tekst rada:
Pristup cjelovitom tekstu rada doi fulir.irb.hr www.sciencedirect.com doi.orgCitiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus